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Full-Text Articles in Engineering
Biparametric Analyses Of Charge Trapping In Cd0.9Zn0.1Te Based Virtual Frisch Grid Detectors, S. K. Chaudhuri, K. J. Zavalla, R. M. Krishna, K. C. Mandal
Biparametric Analyses Of Charge Trapping In Cd0.9Zn0.1Te Based Virtual Frisch Grid Detectors, S. K. Chaudhuri, K. J. Zavalla, R. M. Krishna, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Defect Levels In Cu₂Znsn(Sₓse₁₋ₓ)₄ Solar Cells Probed By Current-Mode Deep Level Transient Spectroscopy, S. Das, S. K. Chaudhuri, R. N. Bhattacharya, K. C. Mandal
Defect Levels In Cu₂Znsn(Sₓse₁₋ₓ)₄ Solar Cells Probed By Current-Mode Deep Level Transient Spectroscopy, S. Das, S. K. Chaudhuri, R. N. Bhattacharya, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Biparametric Analyses Of Charge Trapping In Cd0.9Zn0.1Te Based Virtual Frisch Grid Detectors, S. K. Chaudhuri, K. J. Zavalla, R. M. Krishna, K. C. Mandal
Biparametric Analyses Of Charge Trapping In Cd0.9Zn0.1Te Based Virtual Frisch Grid Detectors, S. K. Chaudhuri, K. J. Zavalla, R. M. Krishna, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Biparametric Analyses Of Charge Trapping In Cd0.9Zn0.1Te Based Virtual Frisch Grid Detectors, S. K. Chaudhuri, K. J. Zavalla, R. M. Krishna, K. C. Mandal
Biparametric Analyses Of Charge Trapping In Cd0.9Zn0.1Te Based Virtual Frisch Grid Detectors, S. K. Chaudhuri, K. J. Zavalla, R. M. Krishna, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Characterization Of Deep Levels In N-Type And Semi-Insulating 4h-Sic Epitaxial Layers By Thermally Stimulated Current Spectroscopy, P. G. Muzykov, Ramesh Madhu Krishna, K. C. Mandal
Characterization Of Deep Levels In N-Type And Semi-Insulating 4h-Sic Epitaxial Layers By Thermally Stimulated Current Spectroscopy, P. G. Muzykov, Ramesh Madhu Krishna, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Defect Levels In Cu₂Znsn(Sₓse₁₋ₓ)₄ Solar Cells Probed By Current-Mode Deep Level Transient Spectroscopy, S. Das, S. K. Chaudhuri, R. N. Bhattacharya, K. C. Mandal
Defect Levels In Cu₂Znsn(Sₓse₁₋ₓ)₄ Solar Cells Probed By Current-Mode Deep Level Transient Spectroscopy, S. Das, S. K. Chaudhuri, R. N. Bhattacharya, K. C. Mandal
Krishna C. Mandal
No abstract provided.
Characterization Of Deep Levels In N-Type And Semi-Insulating 4h-Sic Epitaxial Layers By Thermally Stimulated Current Spectroscopy, P. G. Muzykov, Ramesh Madhu Krishna, K. C. Mandal
Characterization Of Deep Levels In N-Type And Semi-Insulating 4h-Sic Epitaxial Layers By Thermally Stimulated Current Spectroscopy, P. G. Muzykov, Ramesh Madhu Krishna, K. C. Mandal
Krishna C. Mandal
No abstract provided.