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Materials’ Properties Measurements: Choosing The Optimal Scanning Probe Microscope Configuration, Nancy Burnham, G Gremaud, A Kulik, P Gallo, F Oulevey
Materials’ Properties Measurements: Choosing The Optimal Scanning Probe Microscope Configuration, Nancy Burnham, G Gremaud, A Kulik, P Gallo, F Oulevey
Nancy A. Burnham
Rheological models are used to represent different scanning probe microscope configurations. The solutions for their static and dynamic behavior are found and used to analyze which scanning probe microscope configuration is best for a given application. We find that modulating the sample at high frequencies results in the best microscope behavior for measuring the stiffness of rigid materials, and that by modulating the tip at low frequencies and detecting the motion of the tip itself (not its position relative to the tip holder) should be best for studying compliant materials in liquids.
Accounting For The Stiffnesses Of The Probe And Sample In Scanning Probe Microscopy*, Nancy Burnham
Accounting For The Stiffnesses Of The Probe And Sample In Scanning Probe Microscopy*, Nancy Burnham
Nancy A. Burnham
The elements of a scanning probe microscope are modeled as a set of springs in series. For a single‐component sample, that is, a sample consisting of only one material, the detected feature height in variable force (force microscopy) or variable current (tunneling microscopy) modes is a function of the total system stiffness and the stiffness of the detector. For a multicomponent sample, the data in both variable force (current) and constant force (current) modes are modified by the set‐point force, the detector stiffness, and the relative stiffnesses of the components of the sample. A detection scheme for reducing this compliance …