Engineering Commons^™

Vector Magneto-Optical Generalized Ellipsometry For Determining Magneto-Optical Properties Of Thin Films, Chad Briley

Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research

Modern growth techniques allow for highly complex nano scale thin films to be created. These new films possess highly anisotropic properties structurally, optically, and magnetically that are significantly different from that of their bulk counterparts and must be accurately characterized in order to optimize desired properties for applications in next generation devices. Current magnetometry techniques focus on high symmetry characterization, namely in and out of the sample plane, and therefore do not possess the capabilities to fully explore these anisotropic properties without complicated setups and multiple sample manipulations. The author describes a setup that combines generalized ellipsometry with an octu-pole …