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Full-Text Articles in Engineering
X-Ray Photoemission Analysis Of Chemically Treated Gate Semiconductor Surfaces For Radiation Detector Applications, A. J. Nelson, A. M. Conway, B. W. Sturm, E. M. Behymer, C. E. Reinhardt, R. J. Nikolic, S. A. Payne, G. Pabst, K. C. Mandal
X-Ray Photoemission Analysis Of Chemically Treated Gate Semiconductor Surfaces For Radiation Detector Applications, A. J. Nelson, A. M. Conway, B. W. Sturm, E. M. Behymer, C. E. Reinhardt, R. J. Nikolic, S. A. Payne, G. Pabst, K. C. Mandal
Faculty Publications
No abstract provided.
Deep Levels In Gate And Gate:In Crystals Investigated By Deep-Level Transient Spectroscopy And Photoluminescence, Y. Cui, D. D. Caudel, P. Bhattacharya, A. Burger, K. C. Mandal, D. Johnstone, S. A. Payne
Deep Levels In Gate And Gate:In Crystals Investigated By Deep-Level Transient Spectroscopy And Photoluminescence, Y. Cui, D. D. Caudel, P. Bhattacharya, A. Burger, K. C. Mandal, D. Johnstone, S. A. Payne
Faculty Publications
No abstract provided.