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Electrical and Electronics

Electrical Engineering Faculty Publications

Series

2010

Articles 1 - 3 of 3

Full-Text Articles in Engineering

Finding The Exact Maximum Impedance Resonant Frequency Of A Practical Parallel Resonant Circuit Without Calculus, Kenneth V. Cartwright, Elton Joseph, Edit J. Kaminsky Oct 2010

Finding The Exact Maximum Impedance Resonant Frequency Of A Practical Parallel Resonant Circuit Without Calculus, Kenneth V. Cartwright, Elton Joseph, Edit J. Kaminsky

Electrical Engineering Faculty Publications

A practical parallel resonant circuit has a resistor in series

with an inductor, and that combination is in parallel with a

capacitor. For such a circuit, it is well known that there are

two possible definitions for the resonant frequency: (i) the

resonant frequency , p f which is the frequency at which the

phase of the total impedance is zero, and (ii) the resonant

frequency m f , which is the frequency that achieves maximum

magnitude of the total impedance. To find the latter

traditionally requires calculus. However, in this paper, the

authors show how m f

can be …


Return-Path, Multiple-Principal-Angle, Internal-Reflection Ellipsometer For Measuring Ir Optical Properties Of Aqueous Solutions, Rasheed M.A. Azzam Sep 2010

Return-Path, Multiple-Principal-Angle, Internal-Reflection Ellipsometer For Measuring Ir Optical Properties Of Aqueous Solutions, Rasheed M.A. Azzam

Electrical Engineering Faculty Publications

A retroreflection (return-path) spectroscopic ellipsometer without a wave plate is described that uses an IR-transparent high-refractive-index hemicylindrical semiconductor substrate to measure the optical properties of aqueous solutions from multiple principal angles and multiple principal azimuths of attenuated internal reflection (AIR) at the semiconductor–solution interface. The pseudo-Brewster angle of minimum reflectance for the p polarization is also readily measured using the same instrument. This wealth of data can also be used to characterize thin films at the solid–liquid interface. Simulated results of AIR at the Si–water interface over the 1.2–11 μm IR spectral range are presented in support of this concept. …


Transmission Of P- And S-Polarized Light Through A Prism And The Condition Of Minimum Deviation, R. M.A. Azzam, Ryan M. Adams Aug 2010

Transmission Of P- And S-Polarized Light Through A Prism And The Condition Of Minimum Deviation, R. M.A. Azzam, Ryan M. Adams

Electrical Engineering Faculty Publications

The condition of minimum deviation (MD) by a transparent optically isotropic prism is re-derived, and expressions for the intensity transmittances Tp(θ) and Ts(θ) of an uncoated prism of refractive index n and prism angle α for incident p- ands-polarized light and their derivatives with respect to the internal angle of refraction θ are obtained. When the MD condition(θ=α/2) is satisfied, Ts is maximum and Tp is maximum or minimum. The transmission ellipsometric parametersψt,Δt of a symmetrically coated prism are also shown to be locally stationary with respect to θ at θ=α/2 . The constraint on (n,α) for …