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Electrical and Computer Engineering

Theses/Dissertations

2011

Reliability (Engineering)

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Full-Text Articles in Engineering

Cyber Physical Complex Networks, Modeling, Analysis, And Control, Neveen Shlayan Aug 2011

Cyber Physical Complex Networks, Modeling, Analysis, And Control, Neveen Shlayan

UNLV Theses, Dissertations, Professional Papers, and Capstones

This research scrutinize various attributes of complex networks; mainly, modeling, sensing, estimation, safety analysis, and control. In this study, formal languages and finite automata are used for modeling incident management processes. Safety properties are checked in order to verify the system. This method introduces a systematic approach to incident management protocols that are governed by mostly unsystematic algorithms. A portion of the used data in this study is collected by means of radar and loop detectors. A weighted t-statistics methodology is developed in order to validate these detectors. The detector data is then used to extract travel time information where …


Cmos Rf Cituits Sic] Variability And Reliability Resilient Design, Modeling, And Simulation, Yidong Liu Jan 2011

Cmos Rf Cituits Sic] Variability And Reliability Resilient Design, Modeling, And Simulation, Yidong Liu

Electronic Theses and Dissertations

The work presents a novel voltage biasing design that helps the CMOS RF circuits resilient to variability and reliability. The biasing scheme provides resilience through the threshold voltage (VT) adjustment, and at the mean time it does not degrade the PA performance. Analytical equations are established for sensitivity of the resilient biasing under various scenarios. Power Amplifier (PA) and Low Noise Amplifier (LNA) are investigated case by case through modeling and experiment. PTM 65nm technology is adopted in modeling the transistors within these RF blocks. A traditional class-AB PA with resilient design is compared the same PA without such design …


Reliability Study Of Ingap/Gaas Heterojunction Bipolar Transistor Mmic Technology By Characterization, Modeling And Simulation, Xiang Liu Jan 2011

Reliability Study Of Ingap/Gaas Heterojunction Bipolar Transistor Mmic Technology By Characterization, Modeling And Simulation, Xiang Liu

Electronic Theses and Dissertations

Recent years have shown real advances of microwave monolithic integrated circuits (MMICs) for millimeter-wave frequency systems, such as wireless communication, advanced imaging, remote sensing and automotive radar systems, as MMICs can provide the size, weight and performance required for these systems. Traditionally, GaAs pseudomorphic high electron mobility transistor (pHEMT) or InP based MMIC technology has dominated in millimeter-wave frequency applications because of their high fT and fmax as well as their superior noise performance. But these technologies are very expensive. Thus, for low cost and high performance applications, InGaP/GaAs heterojunction bipolar transistors (HBTs) are quickly becoming the preferred technology to …


Investigation And Trade Study On Hot Carrier Reliability Of The Phemt For Dc And Rf Performance, Jason Steighner Jan 2011

Investigation And Trade Study On Hot Carrier Reliability Of The Phemt For Dc And Rf Performance, Jason Steighner

Electronic Theses and Dissertations

A unified study on the hot carrier reliability of the Pseudomorphic High Electron Mobility Transistor (PHEMT) is carried out through Sentaurus Device Simulation, measurement, and physical analyses. A trade study of devices with four various geometries are evaluated for DC and RF performance. The trade-off of DC I-V characteristics, transconductance, and RF parameters versus hot carrier induced gate current is assessed for each device. Ambient temperature variation is also evaluated to observe its impact on hot carrier effects. A commercial grade PHEMT is then evaluated and measured to demonstrate the performance degradation that occurs after a period of operation in …