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Automating Variation And Repeater Analysis In Physical Design Of Integrated Circuits, Subrat Mahalik
Automating Variation And Repeater Analysis In Physical Design Of Integrated Circuits, Subrat Mahalik
Dissertations and Theses
Rapid advancement and innovation in semiconductor research have continuously helped in designing efficient and complex integrated circuits in miniature size. As the device technology, is aggressively scaling to improve the device performance, the issues related to device interconnects, power, and reliability have become a major concern for the designers. These challenges make the design and validation of ASIC extremely complicated.
The primary idea of this work is to develop automation tools, to be used in the physical design flows to improve the efficiency of the design flow. The first tool named as variation analysis tool automates the on-chip variation modeling …
Training Set Design For Test Removal Classication In Ic Test, Nagarjun Hassan Ranganath
Training Set Design For Test Removal Classication In Ic Test, Nagarjun Hassan Ranganath
Dissertations and Theses
This thesis reports the performance of a simple classifier as a function of its training data set. The classifier is used to remove analog tests and is named the Test Removal Classifier (TRC).
The thesis proposes seven different training data set designs that vary by the number of wafers in the data set, the source of the wafers and the replacement scheme of the wafers. The training data set size ranges from a single wafer to a maximum of five wafers. Three of the training data sets include wafers from the Lot Under Test (LUT). The training wafers in the …
Data Driven Feed Forward Adaptive Testing, Chaitrali Santosh Chandorkar
Data Driven Feed Forward Adaptive Testing, Chaitrali Santosh Chandorkar
Dissertations and Theses
Test cost is a critical component in the overall cost of the product. Test cost varies in direct proportion with test time. This thesis introduces a data driven feed forward adaptive technique for reducing test time at wafer sort while maintaining the product defect level. Test data from first insertion of wafer is statistically analyzed to make a decision about adaptive test flow at subsequent insertions.
The data driven feed forward technique uses a statistical screen to analyze test data from first probe of wafer and provides recommendations for test elimination at second insertions. At the second insertion dies are …