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Vector Magneto-Optical Generalized Ellipsometry On Magnetic Slanted Columnar Heterostructured Thin Films, Chad Briley
Vector Magneto-Optical Generalized Ellipsometry On Magnetic Slanted Columnar Heterostructured Thin Films, Chad Briley
Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research
Modern material growth techniques allow for nano-engineering highly complex three dimensionally nanostructured materials. These nano-engineered materials possess highly anisotropic physical properties that are significantly different from that of their bulk counterparts. The magnetization properties of nano-engineered materials can be modified through a close range interaction known as magnetic exchange. These materials are referred to as magnetic exchange-coupled materials. Exchange-coupled magnetic materials are composite magnetic materials where the magnetization of one material is influenced by the magnetization state of the neighboring materials.
The author describes the creation of a representative sample set of exchange-coupled nanoengineered magnetic materials. These materials are created …
Vector Magneto-Optical Generalized Ellipsometry For Determining Magneto-Optical Properties Of Thin Films, Chad Briley
Vector Magneto-Optical Generalized Ellipsometry For Determining Magneto-Optical Properties Of Thin Films, Chad Briley
Department of Electrical and Computer Engineering: Dissertations, Theses, and Student Research
Modern growth techniques allow for highly complex nano scale thin films to be created. These new films possess highly anisotropic properties structurally, optically, and magnetically that are significantly different from that of their bulk counterparts and must be accurately characterized in order to optimize desired properties for applications in next generation devices. Current magnetometry techniques focus on high symmetry characterization, namely in and out of the sample plane, and therefore do not possess the capabilities to fully explore these anisotropic properties without complicated setups and multiple sample manipulations. The author describes a setup that combines generalized ellipsometry with an octu-pole …