Engineering Commons^™

Characterization And Modeling Of Esd Events, Risk And Protection, Jianchi Zhou

Doctoral Dissertations

“The ESD (Electrostatic discharge) failures have been raising critical reliability problems in electronic devices design. However, not all the ESD scenarios have been specified by the IEC standard and the characterizations of the ESD risk for different scenarios are essential to evaluate the ESD robustness of the devices in the real word.

The insulation of plastic enclosures provides protection against ESD to the electronic system inside. However, seams between plastic parts are often unavoidable. Different plastic arrangements are constructed to investigate the spark length and current derivatives and to understand the ESD spark behavior for geometries having spark lengths longer …

Investigating The Effect Of Operating Condition On Esd-Induced Soft-Failures, Omid Hoseini Izadi

Doctoral Dissertations

"Conflicting observations have been found in the literature regarding the effect of operating conditions on ESD (electrostatic discharge) susceptibility. While some studies have suggested a strong correlation between the two, others observed little to no correlation. In this work, a systematic study has been carried out suggesting the existence of a strong correlation between the ESD susceptibility and operating conditions. It is found that the root cause of this conflict is random ESD noise injection. A measurement approach is proposed to synchronize the noise injection with the system activity such as high/low CPU load. In this approach, the current consumption …

Tvs Transient Behavior Modeling Method, And System-Level Effective Esd Design For Usb3.X Interface, Pengyu Wei

Masters Theses

"This research proposal presents a methodology whereby a protection device can be modeled in SPICE compatible platforms with respect to the transient behaviors during Electrostatic Discharge (ESD) events. This methodology uses an exclusively "black-box" approach to characterize the parameters of the protection device, thereby allowing it to be implemented without intimate knowledge of the DUT. Results of this methodology can be used to predict the transient response (conductivity modulation and snapback delay) of the ESD protection devices, and thereby predicts how much current could flow into the device (typically a digital IO pin) under protection. The transient behavior modeling methodology …

Esd Related Soft Error Detection And Root Cause Analysis, Suyu Yang

Masters Theses

"In this article, several methods are outlined for detecting functional changes in an IC due to external interference such as ESD or EMI. The goal is to provide diagnostic tools for detection of potential soft failure susceptibilities of complex systems during the hardware design stage without the aid of any complex software. After the soft errors are found, circuit modeling techniques are used to characterize the DUT. By running the circuit model, the soft error threshold can be predicted and the circuit model can be used to evaluate the performance of other ESD protection methods. In the end several methods …

On-Die Sensors For Transient Events, Mihir Vimal Suchak

Masters Theses

"Failures caused by transient electromagnetic events like Electrostatic Discharge (ESD) are a major concern for embedded systems. The component often failing is an integrated circuit (IC). Determining which IC is affected in a multi-device system is a challenging task. Debugging errors often requires sophisticated lab setups which require intentionally disturbing and probing various parts of the system which might not be easily accessible. Opening the system and adding probes may change its response to the transient event, which further compounds the problem.

On-die transient event sensors were developed that require relatively little area on die, making them inexpensive, they consume …

Esd Event Locator, Syed Abrar Ul Huq

Masters Theses

"Electrostatic Discharge (ESD) presents one of the most common threats to electronic systems especially in the cases of high-speed digital systems. ESD event locator systems have been designed to determine the location of the source of the ESD event using different techniques. One such method of determining the origin of the ESD event, is the use of four antennas and a high-speed Analog to Digital Converter (ADC) system to capture the ESD events.

This thesis presents such an implementation which deals with the design of an analog front-end to a fast TI LM97600 ADC and a Virtex-5 Field-Programmable Gated Array …