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Electrical and Computer Engineering
Missouri University of Science and Technology
Electrical and Computer Engineering Faculty Research & Creative Works
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Full-Text Articles in Engineering
Securing The Transportation Of Tomorrow: Enabling Self-Healing Intelligent Transportation, Elanor Jackson, Sahra Sedigh Sarvestani
Securing The Transportation Of Tomorrow: Enabling Self-Healing Intelligent Transportation, Elanor Jackson, Sahra Sedigh Sarvestani
Electrical and Computer Engineering Faculty Research & Creative Works
The safety of autonomous vehicles relies on dependable and secure infrastructure for intelligent transportation. The doctoral research described in this paper aims to enable self-healing and survivability of the intelligent transportation systems required for autonomous vehicles (AV-ITS). The proposed approach is comprised of four major elements: qualitative and quantitative modeling of the AV-ITS, stochastic analysis to capture and quantify interdependencies, mitigation of disruptions, and validation of efficacy of the self-healing process. This paper describes the overall methodology and presents preliminary results, including an agent-based model for detection of and recovery from disruptions to the AV-ITS.
Characterization And Modeling Of Sparkless Discharge To A Touch Screen Display, Jianchi Zhou, Cheung Wei Lam, Zhekun Peng, Daryl G. Beetner, David Pommerenke
Characterization And Modeling Of Sparkless Discharge To A Touch Screen Display, Jianchi Zhou, Cheung Wei Lam, Zhekun Peng, Daryl G. Beetner, David Pommerenke
Electrical and Computer Engineering Faculty Research & Creative Works
Although Corona Discharge to a Touchscreen Display is Not Associated with the Spark, It Could Cause Soft and Hard Failures Due to Electromagnetic Coupling to Sensitive Electronics Beneath the Glass. Experimental Data Were Obtained to Characterize These Sparkless Discharges and an Equivalent Circuit Model Was Constructed to Predict the Resulting Coupling to Touchscreen Electronics. Measurements and Simulation Indicate that a Thinner Glass and a Higher Touchscreen Indium-Tin-Oxide (ITO) Sense Trace Impedance Both Lead to Higher ESD Risk by Delivering Higher Energy into the Sensing IC. a CST Co-Simulation Model is Proposed and is Shown to Model the Displacement Current Accurately. …