Open Access. Powered by Scholars. Published by Universities.®

Engineering Commons

Open Access. Powered by Scholars. Published by Universities.®

Electrical and Computer Engineering

Brigham Young University

2019

Common cause failure

Articles 1 - 1 of 1

Full-Text Articles in Engineering

Improving The Single Event Effect Response Of Triple Modular Redundancy On Sram Fpgas Through Placement And Routing, Matthew Joel Cannon Aug 2019

Improving The Single Event Effect Response Of Triple Modular Redundancy On Sram Fpgas Through Placement And Routing, Matthew Joel Cannon

Theses and Dissertations

Triple modular redundancy (TMR) with repair is commonly used to improve the reliability of systems. TMR is often employed for circuits implemented on field programmable gate arrays (FPGAs) to mitigate the radiation effects of single event upsets (SEUs). This has proven to be an effective technique by improving a circuit's sensitive cross-section by up to 100x. However, testing has shown that the improvement offered by TMR is limited by upsets in single configuration bits that cause TMR to fail.This work proposes a variety of mitigation techniques that improve the effectiveness of TMR on FPGAs. These mitigation techniques can alter the …