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Full-Text Articles in Engineering
Worse-Than-Rayleigh Fading: Experimental Results And Theoretical Models, David W. Matolak, Jeff Frolik
Worse-Than-Rayleigh Fading: Experimental Results And Theoretical Models, David W. Matolak, Jeff Frolik
Faculty Publications
This article is motivated by the recent recognition that channel fading for new wireless applications is not always well described by traditional models used for mobile communication systems. In particular, fading data collected for vehicleto- vehicle and wireless sensor network applications has motivated new models for conditions in which channel fading statistics can be worse than Rayleigh. We review the use of statistical channel models, describe our example applications, and provide both measured and modeling results for these severe fading conditions.
Relocatable Field Programmable Gate Array Bitstreams For Fault Tolerance, David P. Montminy, Rusty O. Baldwin, Paul D. Williams
Relocatable Field Programmable Gate Array Bitstreams For Fault Tolerance, David P. Montminy, Rusty O. Baldwin, Paul D. Williams
AFIT Patents
A Field Programmable Gate Array (FPGA) circuit capable of operating through at least one fault. The FPGA circuit includes a configuration memory and an embedded microprocessor. The embedded microprocessor having access to the configuration memory, static modules, at least one relocatable module, and at least one spare module. The relocatable module being relocatable from a first target area to a second target area. The relocatable module being relocatable by manipulating a partial bitstream with the embedded microprocessor. The microprocessor calculating a plurality of bitstream changes, to relocate the at least one relocatable module using at least triple modular redundancy (TMR).