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Full-Text Articles in Engineering
Fault And Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices, George R. Roelke Iv
Fault And Defect Tolerant Computer Architectures: Reliable Computing With Unreliable Devices, George R. Roelke Iv
Theses and Dissertations
This research addresses design of a reliable computer from unreliable device technologies. A system architecture is developed for a "fault and defect tolerant" (FDT) computer. Trade-offs between different techniques are studied and yield and hardware cost models are developed. Fault and defect tolerant designs are created for the processor and the cache memory. Simulation results for the content-addressable memory (CAM)-based cache show 90% yield with device failure probabilities of 3 x 10(-6), three orders of magnitude better than non fault tolerant caches of the same size. The entire processor achieves 70% yield with device failure probabilities exceeding 10(-6). The required …
High-Speed Digital And Mixed-Signal Components For X– And Ku–Band Direct Digital Synthesizers In Indium Phosphide Dhbt Technology, Steven Eugene Turner
High-Speed Digital And Mixed-Signal Components For X– And Ku–Band Direct Digital Synthesizers In Indium Phosphide Dhbt Technology, Steven Eugene Turner
Electronic Theses and Dissertations
Recently reported double heterojunction bipolar transistor (DHBT) devices manufactured in Indium Phosphide (InP) technology with ft and fmax both over 300 GHz enable advanced high-speed digital and mixed-signal circuits. In this thesis, the use of InP DHBT devices for high-speed accumulator circuits and X– and Ku–band direct digital synthesizer (DDS) circuits are investigated. At these frequencies, new technological challenges in the design of digital and mixed-signal circuits arise in areas including power consumption and clock distribution. This thesis addresses the speed/power tradeoffs in high-speed accumulator designs, the design of DDS circuits, and clock distribution simulation. The results of six accumulator …
Hiring Process For Software Developers That Identifies Both Cultural And Technical Fit, David E. Berry
Hiring Process For Software Developers That Identifies Both Cultural And Technical Fit, David E. Berry
Seton Hall University Dissertations and Theses (ETDs)
No abstract provided.