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Computer Sciences

2006

Atomic Force Microscopy

Articles 1 - 2 of 2

Full-Text Articles in Engineering

Adaptive Critic Neural Network Force Controller For Atomic Force Microscope-Based Nanomanipulation, Qinmin Yang, Jagannathan Sarangapani Oct 2006

Adaptive Critic Neural Network Force Controller For Atomic Force Microscope-Based Nanomanipulation, Qinmin Yang, Jagannathan Sarangapani

Electrical and Computer Engineering Faculty Research & Creative Works

Automating the task of nanomanipulation is extremely important since it is tedious for humans. This paper proposes an atomic force microscope (AFM) based force controller to push nano particles on the substrates. A block phase correlation-based algorithm is embedded into the controller for the compensation of the thermal drift which is considered as the main external uncertainty during nanomanipulation. Then, the interactive forces and dynamics between the tip and the particle, particle and the substrate are modeled and analyzed. Further, an adaptive critic NN controller based on adaptive dynamic programming algorithm is designed and the task of pushing nano particles …


Nanomanipulation Using Atomic Force Microscope With Drift Compensation, Qinmin Yang, Jagannathan Sarangapani Jun 2006

Nanomanipulation Using Atomic Force Microscope With Drift Compensation, Qinmin Yang, Jagannathan Sarangapani

Electrical and Computer Engineering Faculty Research & Creative Works

This paper proposes an atomic force microscope (AFM) based force controller to push nanoparticles on the substrates since it is tedious for human. A block phase correlation-based algorithm is embedded into the controller for compensating the thermal drift during nanomanipulation. Further, a neural network (NN) is employed to approximate the unknown nanoparticle and substrate contact dynamics including the roughness effects. Using the NN-based adaptive force controller the task of pushing nanoparticles is demonstrated. Finally, using the Lyapunov-based stability analysis, the uniform ultimately boundedness (UUB) of the closed-loop signals is demonstrated