Open Access. Powered by Scholars. Published by Universities.®
- Institution
- Publication
- Publication Type
Articles 1 - 3 of 3
Full-Text Articles in Engineering
Intrinsic Functions For Securing Cmos Computation: Variability, Modeling And Noise Sensitivity, Xiaolin Xu
Intrinsic Functions For Securing Cmos Computation: Variability, Modeling And Noise Sensitivity, Xiaolin Xu
Doctoral Dissertations
A basic premise behind modern secure computation is the demand for lightweight cryptographic primitives, like identifier or key generator. From a circuit perspective, the development of cryptographic modules has also been driven by the aggressive scalability of complementary metal-oxide-semiconductor (CMOS) technology. While advancing into nano-meter regime, one significant characteristic of today's CMOS design is the random nature of process variability, which limits the nominal circuit design. With the continuous scaling of CMOS technology, instead of mitigating the physical variability, leveraging such properties becomes a promising way. One of the famous products adhering to this double-edged sword philosophy is the Physically …
Benefits Of Considering More Than Temperature Acceleration For Gan Hemt Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy
Benefits Of Considering More Than Temperature Acceleration For Gan Hemt Life Testing, Ronald A. Coutu Jr., Robert A. Lake, Bradley D. Christiansen, Eric R. Heller, Christopher A. Bozada, Brian S. Poling, Glen D. Via, James P. Theimer, Stephen E. Tetlak, Ramakrishna Vetury, Jeffrey B. Shealy
Electrical and Computer Engineering Faculty Research and Publications
The purpose of this work was to investigate the validity of Arrhenius accelerated-life testing when applied to gallium nitride (GaN) high electron mobility transistors (HEMT) lifetime assessments, where the standard assumption is that only critical stressor is temperature, which is derived from operating power, device channel-case, thermal resistance, and baseplate temperature. We found that power or temperature alone could not explain difference in observed degradation, and that accelerated life tests employed by industry can benefit by considering the impact of accelerating factors besides temperature. Specifically, we found that the voltage used to reach a desired power dissipation is important, and …
Standardizing Functional Safety Assessments For Off-The-Shelf Instrumentation And Controls, Andrew Michael Nack
Standardizing Functional Safety Assessments For Off-The-Shelf Instrumentation And Controls, Andrew Michael Nack
Masters Theses
It is typical for digital instrumentation and controls, used to manage significant risk, to undergo substantial amounts of scrutiny. The equipment must be proven to have the necessary level of design integrity. The details of the scrutiny vary based on the particular industry, but the ultimate goal is to provide sufficient evidence that the equipment will operate successfully when performing their required functions.
To be able to stand up to the scrutiny and more importantly, successfully perform the required safety functions, the equipment must be designed to defend against random hardware failures and also to prevent systematic faults. These design …