Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 2 of 2
Full-Text Articles in Engineering
Surface Treatment Of Cement-Based Materials With Nanosio2, Pengkun Hou, Xin Cheng, Jueshi Qian, Surendra P. Shah
Surface Treatment Of Cement-Based Materials With Nanosio2, Pengkun Hou, Xin Cheng, Jueshi Qian, Surendra P. Shah
International Conference on Durability of Concrete Structures
A dense surface structure of cement-based material is favorable for its resistance to the impacts of environment. In this work, effectiveness and mechanisms of the surface treatment of cement-based materials with nanoSiO2 of different states, that is, colloidal nanoSiO2 (CNS) and the in situ formed nanoSiO2 gel through the hydrolysis of its precursor of tetraethoxysilane (TEOS), by brushing and soaking techniques, were investigated. Results showed that both CNS and TEOS are capable of reducing the liquid and gaseous transport properties of hardened cement-based materials, although at a different extent. It revealed that the pozzolanic reactivity and the …
Application Of Nanomechanical Methods In Investigation Of C–S–H Gel/Cement Grain Interface, Jing Xu, David J. Corr, Surendra P. Shah
Application Of Nanomechanical Methods In Investigation Of C–S–H Gel/Cement Grain Interface, Jing Xu, David J. Corr, Surendra P. Shah
International Conference on Durability of Concrete Structures
Investigation on the mechanical properties of cement-based materials at micron and submicron scales is important for understanding the overall performance, particularly of high-performance concrete (HPC). Due to low water-tocement ratio of HPC, a large amount of unhydrated cement grains remain in matrix, and a significant impact of the interface between C–S–H gel and cement grains on concrete behavior could be expected. Recent progress in experimental nanomechanics opens new access to nanoengineering of cement-based composites. In this paper, nanoindentation and viscoelastic modulus mapping were used to study the interfacial properties. The interface width measured by modulus mapping was around 200 nm …