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Full-Text Articles in Engineering
Shale Adhesion Force Measurements Via Atomic Force Microscopy, Nikolai Mitiurev, Michael Verrall, Svetlana Shilobreeva, Alireza Keshavarz, Stefan Iglauer
Shale Adhesion Force Measurements Via Atomic Force Microscopy, Nikolai Mitiurev, Michael Verrall, Svetlana Shilobreeva, Alireza Keshavarz, Stefan Iglauer
Research outputs 2014 to 2021
Wettability of sedimentary rock surface is an essential parameter that defines oil recovery and production rates of a reservoir. The discovery of wettability alteration in reservoirs, as well as complications that occur in analysis of heterogeneous sample, such as shale, for instance, have prompted scientists to look for the methods of wettability assessment at nanoscale. At the same time, bulk techniques, which are commonly applied, such as USBM (United States Bureau of Mines) or Amott tests, are not sensitive enough in cases with mixed wettability of rocks as they provide average wettability values of a core plug. Atomic Force Microscopy …
Phosphine Oxide Containing Poly(Pyridinium Salt)S As Fire Retardant Materials, Maksudul M. Alam, Bidyut Biswas, Alexi K. Nedeltchev, Haesook Han, Asanga D. Ranasinghe, Pradip K. Bhowmik, Kisholoy Goswami
Phosphine Oxide Containing Poly(Pyridinium Salt)S As Fire Retardant Materials, Maksudul M. Alam, Bidyut Biswas, Alexi K. Nedeltchev, Haesook Han, Asanga D. Ranasinghe, Pradip K. Bhowmik, Kisholoy Goswami
Chemistry and Biochemistry Faculty Research
Six new rugged, high-temperature tolerant phosphine oxide-containing poly(4,4′-(p-phenylene)-bis(2,6-diphenylpyridinium)) polymers P-1, P-2, P-3, P-4, P-5, and P-6 are synthesized, characterized, and evaluated. Synthesis results in high yield and purity, as confirmed by elemental, proton (1H), and carbon 13 (13C) nuclear magnetic resonance (NMR) spectra analyses ... See full text for complete abstract.
Structural Characterization Of Aluminum Films Deposited On Sputtered-Titanium Nitride/ Silicon Substrate By Metalorganic Chemical Vapor Deposition From Dimethylethylamine Alane, Xiaodong Li, Byoung-Youp Kim, Shi-Woo Rhee
Structural Characterization Of Aluminum Films Deposited On Sputtered-Titanium Nitride/ Silicon Substrate By Metalorganic Chemical Vapor Deposition From Dimethylethylamine Alane, Xiaodong Li, Byoung-Youp Kim, Shi-Woo Rhee
Faculty Publications
Alfilmsdeposited on sputtered‐TiN/Si substrate by metalorganic chemical vapor deposition(MOCVD) from dimethylethylamine alane (DMEAA) were characterized using x‐ray diffraction(XRD),Auger electron spectroscopy(AES),atomic force microscopy(AFM), and transmission electron microscopy (TEM). The TiN filmsputtered on the Si has a preferred orientation along the growth direction with the 〈111〉 of the film parallel to the Si〈111〉. Sputtering of the TiN film on the Si induced strains at the interface. The TiN/Si interface is flat while the Al/TiN interface is rough. There exist many dislocations at the Al/TiN interface. The Al2O3 phase was formed at the Al/TiN interface during the early stages of …