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AFM; Biocompatibilily; Chitinlchitosan; Ellipsometry; Infrared spectra; Visiblc; Ultraviolet; Spectroscopy
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Full-Text Articles in Engineering
Uv-Vis -Infrared Optical And Afm Study Of Spin-Cast Chitosan Films, W H. Nosal, D. W. Thompson, Sabyasachi Sarkar, Anuradha Subramanian, John A. Woollam, L Yan
Uv-Vis -Infrared Optical And Afm Study Of Spin-Cast Chitosan Films, W H. Nosal, D. W. Thompson, Sabyasachi Sarkar, Anuradha Subramanian, John A. Woollam, L Yan
Papers in Biotechnology
Optical properties OS spin-cast chitosan films have been determined in the infrared, visible, and ultraviolet region or the spectrum ~tsing spectroscopic ellipsometry. Optical constants for the Vvis-near IR spectra from 130 to 1700 nm were determined using Cauchy dispersion forms com-bined with Lorentzian oscillator models in the absorptive shorler wavelength regions. Infrared ndex of refraction and extinction coefficients from 750 to 4000cm-' were determined using ellip-sometric data fits to dispersion models based on harmonic oscillators. This modeling determined that optical onisotropy was present and measurable over all wavelength regions of ellipsomctric data. To obtain information on the micro- and nano-scale …