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Nanotechnology Research And Innovation In Russia: A Bibliometric Analysis, Maria Karaulova, Oliver Shackleton, Abdullah Gök, Maxim Kotsemir, Philip Shapira
Nanotechnology Research And Innovation In Russia: A Bibliometric Analysis, Maria Karaulova, Oliver Shackleton, Abdullah Gök, Maxim Kotsemir, Philip Shapira
Philip Shapira
This working paper presents findings from analyses of Russian nanotechnology outputs in publications and patents focusing on developments over the period 1990 through to 2012. The investigation draws on bibliometric datasets of scientific journal publications and patents and on available secondary English-language and Russian sources. The document provides both an overview and detailed analyses of nanotechnology research and innovation in Russia. The examination of publications highlights sectoral trends, leading authors and organizations, and acknowledgements to funding sources. The analysis of patents adds further evidence about patterns of invention and ownership of intellectual property emanating from research and development in Russian …
Patent Overlay Mapping: Visualizing Technological Distance, Luciano Kay, Nils Newman, Jan Youtie, Alan L. Porter, Ismael Rafols
Patent Overlay Mapping: Visualizing Technological Distance, Luciano Kay, Nils Newman, Jan Youtie, Alan L. Porter, Ismael Rafols
Jan Youtie
This paper presents a new global patent map that represents all technological categories and a method to locate patent data of individual organizations and technological fields on the global map. This overlay map technique may support competitive intelligence and policy decision making. The global patent map is based on similarities in citing-to-cited relationships between categories of the International Patent Classification (IPC) of European Patent Office (EPO) patents from 2000 to 2006. This patent data set, extracted from the PATSTAT database, includes 760,000 patent records in 466 IPC-based categories. We compare the global patent maps derived from this categorization to related …