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Generalized Bhaskar Rao Designs With Block Size 4 Signed Over Elementary Abelian Groups , G. Ge, M. Greig, Jennifer Seberry
Generalized Bhaskar Rao Designs With Block Size 4 Signed Over Elementary Abelian Groups , G. Ge, M. Greig, Jennifer Seberry
Professor Jennifer Seberry
de Launey and Seberry have looked at the existence of Generalized Bhaskar Rao designs with block size 4 signed over elementary Abelian groups and shown that the necessary conditions for the existence of a (v, 4, λ; EA(g)) GBRD are sufficient for λ > g with 70 possible exceptions. This article extends that work by reducing those possible exceptions to just a (9,4,18h; EA(9h)) GBRD, where gcd(6, h) = 1, and shows that for λ = g the necessary conditions are sufficient for v > 46.
Identification Of Bad Signatures In Batches, J. Pastuszak, D. Michalek, J. Pieprzyk, Jennifer Seberry
Identification Of Bad Signatures In Batches, J. Pastuszak, D. Michalek, J. Pieprzyk, Jennifer Seberry
Professor Jennifer Seberry
The paper addresses the problem of bad signature identification in batch verification of digital signatures. The number of generic tests necessary to identify all bad signatures in a batch instance, is used to measure the efficiency of verifiers. The divide-and-conquer verifier DCVα(x,n) is defined. The verifier identifies all bad signatures in a batch instance x of the length n by repeatedly splitting the input into α sub-instances. Its properties are investigated. In particular, probability distributions for the number of generic tests necessary to identify one, two and three bad signatures, are derived. The average numbers of GT tests necessary to …