Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 1 of 1
Full-Text Articles in Entire DC Network
In Situ Transmission Electron Microscopy Study Of Electric-Field-Induced Microcracking In Single Crystal Pb(Mg1/3nb2/3)O3–Pbtio3, Z. Xu, Xiaoli Tan, P. Han, J.K. Shang
In Situ Transmission Electron Microscopy Study Of Electric-Field-Induced Microcracking In Single Crystal Pb(Mg1/3nb2/3)O3–Pbtio3, Z. Xu, Xiaoli Tan, P. Han, J.K. Shang
Xiaoli Tan
In this letter, we report in situ transmission electron microscopy (TEM) study of effect of a cyclic electric field on microcracking in a single crystal piezoelectric 0.66Pb(Mg1/3Nb2/3)O3–0.34PbTiO3. A TEM heating stage was modified to permit the in situ application of an electric field on the TEM sample surface. Microcrack initiation from a fine pore under an applied cyclic electric field was directly observed in the piezoelectric single crystal. Experimental procedures for in situ TEM studies were described.