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Genome-Wide Association Analysis Permits Characterization Of Stagonospora Nodorum Blotch (Snb) Resistance In Hard Winter Wheat, Rami Altameemi
Genome-Wide Association Analysis Permits Characterization Of Stagonospora Nodorum Blotch (Snb) Resistance In Hard Winter Wheat, Rami Altameemi
Electronic Theses and Dissertations
Stagonospora nodorum blotch (SNB) is an economically important wheat disease caused by the necrotrophic fungus Parastagonospora nodorum. SNB resistance in wheat is controlled by several quantitative trait loci (QTLs). Thus, the identifying of novel resistance/susceptibility QTLs is crucial for continuous improvement of the SNB resistance. Here, the hard winter wheat association mapping panel (HWWAMP) comprising accessions from breeding programs in the Great Plains region of the US, was evaluated for SNB resistance and necrotrophic effectors (NEs) sensitivity at the seedling stage. A genome-wide association study (GWAS) was performed to identify singlenucleotide polymorphism (SNP) markers associated with SNB resistance and …
Predicting Farinograph Stability Of Wheat Flour With Mixograph And Glutomatic Tests, Brooke Shumate
Predicting Farinograph Stability Of Wheat Flour With Mixograph And Glutomatic Tests, Brooke Shumate
Electronic Theses and Dissertations
Hard red spring wheat (Triticum aestivum L.; HRSW) flour is typically used to produce wheat-based foods where dough strength is a key quality component. Maintaining acceptable levels of dough strength is an important goal in the development of new HRSW cultivars. In a commercial setting, dough strength is often measured as Farinograph stability, though due to various resource constraints, stability is often predicted in breeding programs via other methods like the Mixograph. The objective of this research was to combine Glutomatic with Mixograph data to determine whether Farinograph stability predictions might be improved over the use of Mixograph data …
Molecular Characterization Of Spot Blotch And Bacterial Leaf Streak Resistance In Bread Wheat, Girma Ayana
Molecular Characterization Of Spot Blotch And Bacterial Leaf Streak Resistance In Bread Wheat, Girma Ayana
Electronic Theses and Dissertations
Spot blotch (SB), caused by Bipolaris sorokiniana (Sacc.) Shoem, and bacterial leaf streak (BLS), caused by Xanthomonas translucens pv. undulosa (Smith et al.), two important foliar diseases of wheat in the major production regions of the US and the world. Deployment of adequate host resistance against them depends on determining the resistance genes or quantitative trait loci (QTLs) responsible for the trait and identification of genetic markers linked to QTL that facilitate markers assisted breeding. We conducted two independent studies and characterized QTLs for BLS and SB resistance. In the first study, we constructed a genetic linkage map of 1,211 …