Digital Commons Network^™

Evaluation Of Strain Distortion Correction Protocol Using Scanning Electron Microscopy And Digital Image Correlation, Alexandra Mallory, Alberto Mello, Michael Sangid

The Summer Undergraduate Research Fellowship (SURF) Symposium

Scanning electron microscopy in combination with digital image correlation (SEM-DIC) is a useful technique for measuring strain in materials at the micro-scale. In particular, it can be used to identify micro-scale strain localizations that are the precursor to material failure. While SEM produces high resolution images of the microstructure, the images also contain a large amount of distortion that, during DIC, will result in distorted strain values that require correction. In this project, a nickel-based alloy underwent cyclic mechanical fatigue at three different high temperatures to a targeted maximum strain. Scanning electron microscopy imaging was done on a 200x150μm area …

Synthesis And Characterization Of Kesterite Cu2znsns4 (Czts) Thin Films For Solar Cell Application, Mohamed M.A. Abusnina

Electronic Theses and Dissertations

The quaternary compound Cu₂ZnSnS₄ (CZTS) gained considerable attention in the last decade due to its potential as an active-layer semiconductor for low-cost thin-film solar cells. The material is composed of nontoxic and Earth-abundant constituents, has optical properties suitable for photovoltaic application, and can be synthesized using a wide variety of methods.

Polycrystalline CZTS was grown in this work using vacuum-based deposition to first deposit metal films (precursors) of Cu, Zn, and Sn. In a subsequent step, the precursors underwent an annealing treatment in sulfur vapor environment (sulfurization) to form CZTS. Using sputtering, a physical vapor deposition (PVD) …