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Full-Text Articles in Engineering
Secondary Electron Yield Measurements Of Carbon Nanotube Forests: Dependence On Morphology And Substrate, Brian Wood, Jordan Lee, Gregory Wilson, T. -C. Shen, Jr Dennison
Secondary Electron Yield Measurements Of Carbon Nanotube Forests: Dependence On Morphology And Substrate, Brian Wood, Jordan Lee, Gregory Wilson, T. -C. Shen, Jr Dennison
Journal Articles
Total, secondary, and backscatter electron yield data were taken with beam energies between 15 eV and 30 keV, in conjunction with energy emission data, to determine the extent of suppression of yield caused by carbon nanotube (CNT) forest coatings on substrates. CNT forests can potentially lower substrate yield due to both its inherently low-yield, low-atomic number (Z) carbon composition, and its bundled, high-aspect ratio structure. Rough surfaces, and in particular, surfaces with deep high-aspect-ratio voids, can suppress yields, as the electrons emitted from lower lying surfaces are recaptured by surface protrusions rather than escaping the near-surface region. Yields of multilayered …