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Simulations Of Ion Thruster Plume Contamination With A Whole Grid Sputtered Mo Source Model, Daoru Frank Han, Joseph J. Wang
Simulations Of Ion Thruster Plume Contamination With A Whole Grid Sputtered Mo Source Model, Daoru Frank Han, Joseph J. Wang
Mechanical and Aerospace Engineering Faculty Research & Creative Works
A particle simulation based source model is developed to calculate the density distribution of the sputtered Mo atoms for a whole ion optics grid. The source model is used in PIC simulation of ion thruster plume contamination for 3-grid and 2-grid ion thrusters. The results show that the commonly used point-source approximation for sputtered Mo atoms is oversimplified and would lead to over-prediction of contamination deposition.