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Research Collection Lee Kong Chian School Of Business

Industrial and Organizational Psychology

Adverse impact

2005

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The Risk Of Adverse Impact In Selections Based On A Test With Known Effect Size, Wilfried De Corte, Filip Lievens Oct 2005

The Risk Of Adverse Impact In Selections Based On A Test With Known Effect Size, Wilfried De Corte, Filip Lievens

Research Collection Lee Kong Chian School Of Business

The authors derive the exact sampling distribution function of the adverse impact (AI) ratio for single-stage, top-down selections using tests with known effect sizes. Subsequently, it is shown how this distribution function can be used to determine the risk that a future selection decision on the basis of such tests will result in an outcome that reflects the presence of AI. The article therefore provides test and selection practitioners with a valuable tool to decide between alternative selection predictors.