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A Novel Method For Determination Of Dielectric Properties Of Materials Using A Combined Embedded Modulated Scattering And Near-Field Microwave Techniques-Part Ii: Dielectric Property Recalculation, R. Zoughi, Dana Hughes
A Novel Method For Determination Of Dielectric Properties Of Materials Using A Combined Embedded Modulated Scattering And Near-Field Microwave Techniques-Part Ii: Dielectric Property Recalculation, R. Zoughi, Dana Hughes
Electrical and Computer Engineering Faculty Research & Creative Works
The use of combined embedded modulated scattering technique and near-field microwave nondestructive testing techniques is investigated as a novel method for evaluating the dielectric properties of a material. The forward formulation for determining the reflection coefficient at the aperture of a waveguide radiating into a dielectric half-space in which a PIN diode-loaded dipole (i.e., modulated scattering technique probe) is embedded was presented in Part I of this paper. Here, in Part II, the recalculation of the dielectric properties, using the results of the forward model, is presented along with some associated experimental results.
A Novel Method For Determination Of Dielectric Properties Of Materials Using A Combined Embedded Modulated Scattering And Near-Field Microwave Techniques-Part I: Forward Model, Dana M. Hughes, R. Zoughi
A Novel Method For Determination Of Dielectric Properties Of Materials Using A Combined Embedded Modulated Scattering And Near-Field Microwave Techniques-Part I: Forward Model, Dana M. Hughes, R. Zoughi
Electrical and Computer Engineering Faculty Research & Creative Works
The use of combined embedded modulated scattering technique and near-field microwave nondestructive testing techniques is investigated as a novel method for evaluating the dielectric properties of a material. The forward formulation for determining the reflection coefficient at the aperture of a waveguide radiating into a dielectric half-space in which a PIN diode-loaded dipole (i.e., modulated scattering technique probe) is embedded is presented. This formulation is based upon calculating the near-field coupling between the waveguide and the dipole as a mutual impedance.
Determination Of Microwave Dielectric Properties Of Materials Using A Unique Application Of Embedded Modulated Scatterer Technique, Gabriel S. Freiburger, R. Zoughi
Determination Of Microwave Dielectric Properties Of Materials Using A Unique Application Of Embedded Modulated Scatterer Technique, Gabriel S. Freiburger, R. Zoughi
Electrical and Computer Engineering Faculty Research & Creative Works
The embedded modulated scatterer technique has been investigated in the past as a means of determining the dielectric properties of a material of interest using an open-ended rectangular waveguide and an embedded PIN diode-loaded dipole probe. This technique has been further explored in a unique application utilizing the complex ratio of dynamic reflection coefficients for the two states of the modulated dipole probe. By utilizing this ratio, the calculation of dielectric properties becomes independent of measurement parameters such as distance, orientation, and location of the dipole probe relative to the waveguide radiator. This paper explores this unique application of the …
Dielectric Material Characterization By Complex Ratio Of Embedded Modulated Scatterer Technique States, Gabriel S. Freiburger, R. Zoughi
Dielectric Material Characterization By Complex Ratio Of Embedded Modulated Scatterer Technique States, Gabriel S. Freiburger, R. Zoughi
Electrical and Computer Engineering Faculty Research & Creative Works
The embedded modulated scatterer technique (MST) is an innovative tool which can be used for microwave dielectric characterization of infrastructure and composite structures. By impinging a microwave signal on a loaded thin dipole antenna embedded in a material whose dielectric properties are sought, the resulting refelction data can be used to inversely solve for the dielectric properties of interest. Previous investigations utilized reflection information from a single loaded dipole and required known system parameters, such as radiator polarization vs. dipole alignment and relative distance between radiator and probe, to solve for the sought-for dielectric properties. This paper explores a unique …