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Shear Strength Of R/C Beams Wrapped With Cfrp Fabric, P. Alagusundaramoorthy, Issam E. Harik, Ching Chiaw Choo
Shear Strength Of R/C Beams Wrapped With Cfrp Fabric, P. Alagusundaramoorthy, Issam E. Harik, Ching Chiaw Choo
Kentucky Transportation Center Research Report
The emergence of high strength epoxies has enhanced the feasibility of increasing the shear strength of concrete beams by wrapping with carbon fiber reinforced polymer (CFRP) fabric. The objective of this investigation is to evaluate the increase in shear strength of concrete beams wrapped with different configurations of CFRP fabric. Shear tests are conducted up to failure on two reinforced concrete control beams and twelve reinforced concrete beams wrapped with four different configurations of CFRP fabric. An analytical procedure is presented to predict the shear strength of beams wrapped with CFRP fabric. Comparisons are made between the test results and …
Flexural Behavior Of R/C Beams Strengthened With Cfrp Sheets Or Fabric, P. Alagusundaramoorthy, Issam E. Harik, Ching Chiaw Choo
Flexural Behavior Of R/C Beams Strengthened With Cfrp Sheets Or Fabric, P. Alagusundaramoorthy, Issam E. Harik, Ching Chiaw Choo
Kentucky Transportation Center Research Report
The resistance to electro-chemical corrosion, high-strength to weight ratio, larger creep strain, fatigue resistance, non-magnetic and non-metallic properties of carbon fiber reinforced polymer (CFRP) composites offer a viable alternative to bonding of steel plates in repair and rehabilitation of reinforced concrete structures. The objective of this investigation is to study the effectiveness of externally bonded CFRP sheets or fabric in increasing the flexural strength of concrete beams. Four-point bending flexural tests are conducted up to failure on nine concrete beams strengthened with different layouts of CFRP sheets and fabric, and three beams with different layouts of anchored CFRP sheets. An …
Precise Chemical Analysis Development For Si And Gaas Surfaces, T. A. Briantseva, Z. M. Lebedeva, D. V. Lioubtchenko, M. Nolan, T. S. Perova, R. A. Moore, Kevin Berwick
Precise Chemical Analysis Development For Si And Gaas Surfaces, T. A. Briantseva, Z. M. Lebedeva, D. V. Lioubtchenko, M. Nolan, T. S. Perova, R. A. Moore, Kevin Berwick
Articles
Precise chemical analysis (PCA) was developed to allow the study of non-interconnected atoms on crystalline semiconductor surfaces, such as those produced during rapid thermal processing (RTP) of silicon and electron beam lithography on gallium arsenide (GaAs). The PCA method is based on selectively dissolving the different components present on the semiconductor surface using preferential etchant solutions. After etching, the etchant solution, containing the etched component, is analyzed by a photometric technique. In this paper, we present photometric measurements of the amount of “free” (non-interconnected) atoms that remain on semiconductor surfaces following electron beam and RTP processing. In this context, “free” …