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Full-Text Articles in Physics
Reflectance Of Xuv Light On A Two Dimensional Conducting Rough Surface, Chelsea Thangavelu
Reflectance Of Xuv Light On A Two Dimensional Conducting Rough Surface, Chelsea Thangavelu
Student Works
A Fortran program is set up to solve for the reflectance of XUV light from a rough two dimensional surface, resembling experimental mirrors used to reflect XUV light. Because the roughness of the surface is on the order of magnitude of the wavelength of XUV light, our approach requires a Greene's Function instead of using traditional geometrical optics or physical optics. Our Fortran program calculates the impedance (Z) matrix which requires integration over Greene's Function at non-singular points. The Z matrix helps solve for the induced surface current J(x') at non-singular points. At singular points, the program implements a series …
Exploring The Solvability Of The Jaynes-Cummings And Jaynes-Cummings-Like Models: Implementing Quantum Control, Austen Couvertier
Exploring The Solvability Of The Jaynes-Cummings And Jaynes-Cummings-Like Models: Implementing Quantum Control, Austen Couvertier
Student Works
In this paper we aim to explore the dynamics and overall solvability of the Jaynes-Cummings \& Jaynes-Cummings-Like models. As a lens to understand these dynamics, we focused on cases where the parameters of the system were made time-dependent. All previous work on solving the dynamics of the Jaynes-Cummings models has relied heavily on the use of differential methods and setting the parameters as time-independent constants which were zero or one. To account for this, we utilized the Wei-Norman method which allowed us to analytical solve the time-dependent Hamiltonian. Through the use of this method, we can understand the more general …
Effective Medium Theory, Rough Surfaces, And Moth’S Eyes, David D. Allred, Zephne Larsen, Joseph Muhlestein, R. Steven Turley, Anthony Willey
Effective Medium Theory, Rough Surfaces, And Moth’S Eyes, David D. Allred, Zephne Larsen, Joseph Muhlestein, R. Steven Turley, Anthony Willey
Faculty Publications
Optics in the extreme ultraviolet (XUV) have important applications in microelectronics, microscopy, space physics, and in imaging plasmas. Because of the short wavelengths involved in these applications, it is critical to account for interfacial roughness to accurately predict the reflection and absorption of XUV optics. This paper examines two possible effects of roughness on optical absorption, non-specular reflection and enhanced transmission and compares these to measured experimental data on a rough Y2O3 thin film.
Thorium-Based Thin Films As Highly Reflective Mirrors In The Euv, David D. Allred, William R. Evans, Jed E. Johnson, Richard L. Sandberg, R. Steven Turley
Thorium-Based Thin Films As Highly Reflective Mirrors In The Euv, David D. Allred, William R. Evans, Jed E. Johnson, Richard L. Sandberg, R. Steven Turley
Faculty Publications
As applications for extreme ultraviolet (EUV) radiation have been identified, the demand for better optics has also increased. Thorium and thorium oxide thin films (19 to 61 nm thick) were RF-sputtered and characterized using atomic force microscopy (AFM), spectroscopic ellipsometry, low-angle x-ray diffraction (LAXRD), x-ray photoelectron spectroscopy (XPS), and x-ray absorption near edge structure (XANES) in order to assess their capability as EUV reflectors. Their reflectance and absorption at different energies were also measured and analyzed at the Advanced Light Source in Berkeley. The reflectance of oxidized thorium is reported between 2 and 32 nm at 5, 10, and 15 …