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Full-Text Articles in Physics

Temperature Dependence Of Optical Properties For Amorphous Silicon At Wavelengths Of 632.8 And 752 Nm, P.T. Leung, Nhan Do, Oguz Yavas, Andrew C. Tam, Wing P. Leung, Hee K. Park, Costas P. Grigoropoulos, Johannes Boneberg, Paul Leiderer Apr 1993

Temperature Dependence Of Optical Properties For Amorphous Silicon At Wavelengths Of 632.8 And 752 Nm, P.T. Leung, Nhan Do, Oguz Yavas, Andrew C. Tam, Wing P. Leung, Hee K. Park, Costas P. Grigoropoulos, Johannes Boneberg, Paul Leiderer

Physics Faculty Publications and Presentations

The temperature dependence of the optical properties for amorphous silicon is studied at wavelengths of 632.8 and 752 nm. Both the refractive index and extinction coefficient increase linearly with temperature for 752 nm, while the refractive index decreases and the extinction coefficient increases for 632.8 nm. The rate of increase of the extinction coefficient at 632.8 nm is twice as much as that for 752 nm.


Light-Scattering Technique For The Study Of Dynamic Thickness Fluctuations In Thin Liquid Films, Richard C. Haskell, Daniel C. Petersen, Mark W. Johnson Jan 1993

Light-Scattering Technique For The Study Of Dynamic Thickness Fluctuations In Thin Liquid Films, Richard C. Haskell, Daniel C. Petersen, Mark W. Johnson

All HMC Faculty Publications and Research

The authors describe a light-scattering technique capable of probing the dynamics of thickness fluctuations in lipid bilayers. The technique, which they call reflectance fluctuation spectroscopy (RFS), is keenly sensitive to light scattered from the squeeze modes of motion in a thin liquid film, and insensitive to light scattered from the bend modes. A laser beam is focused to a small spot on the film, and the power in the specularly reflected beam is recorded in real time. Thickness fluctuations associated with the squeeze modes of motion give rise to fluctuations in the power of the specularly reflected light. The frequency ...


Light-Scattering Technique For The Study Of Dynamic Thickness Fluctuations In Thin Liquid Films, Richard C. Haskell, Daniel C. Petersen, Mark W. Johnson Jan 1993

Light-Scattering Technique For The Study Of Dynamic Thickness Fluctuations In Thin Liquid Films, Richard C. Haskell, Daniel C. Petersen, Mark W. Johnson

All HMC Faculty Publications and Research

The authors describe a light-scattering technique capable of probing the dynamics of thickness fluctuations in lipid bilayers. The technique, which they call reflectance fluctuation spectroscopy (RFS), is keenly sensitive to light scattered from the squeeze modes of motion in a thin liquid film, and insensitive to light scattered from the bend modes. A laser beam is focused to a small spot on the film, and the power in the specularly reflected beam is recorded in real time. Thickness fluctuations associated with the squeeze modes of motion give rise to fluctuations in the power of the specularly reflected light. The frequency ...