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Temperature Dependence Of Optical Properties For Amorphous Silicon At Wavelengths Of 632.8 And 752 Nm, P.T. Leung, Nhan Do, Oguz Yavas, Andrew C. Tam, Wing P. Leung, Hee K. Park, Costas P. Grigoropoulos, Johannes Boneberg, Paul Leiderer
Temperature Dependence Of Optical Properties For Amorphous Silicon At Wavelengths Of 632.8 And 752 Nm, P.T. Leung, Nhan Do, Oguz Yavas, Andrew C. Tam, Wing P. Leung, Hee K. Park, Costas P. Grigoropoulos, Johannes Boneberg, Paul Leiderer
Physics Faculty Publications and Presentations
The temperature dependence of the optical properties for amorphous silicon is studied at wavelengths of 632.8 and 752 nm. Both the refractive index and extinction coefficient increase linearly with temperature for 752 nm, while the refractive index decreases and the extinction coefficient increases for 632.8 nm. The rate of increase of the extinction coefficient at 632.8 nm is twice as much as that for 752 nm.