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1990

Thin films

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Full-Text Articles in Physics

Review Of Hall Effect And Magnetoresistance Measurements In Gaas Materials And Devices, David C. Look Jan 1990

Review Of Hall Effect And Magnetoresistance Measurements In Gaas Materials And Devices, David C. Look

Physics Faculty Publications

The use of magnetic fields in the electrical characterization of semiconductor materials is familiar to everyone in the form of Hall‐effect measurements. However, there is another magnetic‐field‐based phenomenon, magnetoresistance (MR), which is highly useful but not nearly so familiar to the majority of workers. One of the unique features of MR measurements is their applicability to common device structures, in particular, field‐effect transistors (FETs) and contact‐resistance patterns. We will show how channel mobility information can be extracted from the MR data in metal‐semiconductor FETs (MESFETs) and modulation‐doped heterostructure FETs (MODFETs), and also how ...