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Full-Text Articles in Physics

Subwavelength Visualization Of Light In Thin Film Waveguides With Photoelectrons, Joseph P. Fitzgerald, Robert Campbell Word, Rolf Könenkamp May 2014

Subwavelength Visualization Of Light In Thin Film Waveguides With Photoelectrons, Joseph P. Fitzgerald, Robert Campbell Word, Rolf Könenkamp

Physics Faculty Publications and Presentations

We report the visualization and quantitative analysis of electromagnetic surface fields at solid surfaces with the potential for λ/50 resolution. To illustrate this capability, we investigate patterns in two-photon photoemission images of light-diffracting structures in waveguiding, transparent thin films. The obtained micrographs show interference patterns between incident and guided light with a remarkable sensitivity to subwavelength features. We demonstrate that photoemission rates are directly related to the surface field strengths and develop a subwavelength method to calculate the surface fields from optical properties and surface topology based on the two-dimensional Kirchhoff diffraction integral. Calculated images based on this theoretical ...


Systems For Assessing And Enhancing The Performance Of Scanning Electron Microscopes By Quantifying And Enforcing Symmetries And Periodicities In Two Dimensions, Peter Moeck Sep 2010

Systems For Assessing And Enhancing The Performance Of Scanning Electron Microscopes By Quantifying And Enforcing Symmetries And Periodicities In Two Dimensions, Peter Moeck

Physics Faculty Publications and Presentations

Scanning probe microscope (SPM) images are enhanced by enforcing one or more symmetries that can be selected based on suitable Fourier coefficient amplitude or phase angle residuals, and/ or geometric Akaike information criteria, and/ or cross correlation techniques. Alternatively, this selection can be based on prior knowledge of specimen characteristics. In addition, a scanning microscope point spread function is obtained based on the evaluation of a calibration image by enforcing at least one symmetry and can be applied to other image acquisitions.


Nanometrology Device Standards For Scanning Probe Mmicroscopes And Processes For Their Fabrication And Use, Peter Moeck Jan 2009

Nanometrology Device Standards For Scanning Probe Mmicroscopes And Processes For Their Fabrication And Use, Peter Moeck

Physics Faculty Publications and Presentations

Nanometrology device standards and methods for fabricating and using such devices in conjunction With scanning probe microscopes are described. The fabrication methods comprise: (1) epitaxial growth that produces nanometer sized islands of knoWn morphology, structural, morphological and chemical stability in typical nanometrology environments, and large height-to-width nano-island aspect ratios, and (2) marking suitable crystallographic directions on the device for alignment With a scanning direction.


Precession Electron Diffraction And Its Advantages For Structural Fingerprinting In The Transmission Electron Microscope, Peter Moeck, Sergei Rouvimov Jan 2009

Precession Electron Diffraction And Its Advantages For Structural Fingerprinting In The Transmission Electron Microscope, Peter Moeck, Sergei Rouvimov

Physics Faculty Publications and Presentations

The foundations of precession electron diffraction in a transmission electron microscope are outlined. A brief illustration of the fact that laboratory-based powder X-ray diffraction fingerprinting is not feasible for nanocrystals is given. A procedure for structural fingerprinting of nanocrystals on the basis of structural data that can be extracted from precession electron diffraction spot patterns is proposed.


Structural Identification Of Cubic Iron-Oxide Nanocrystal Mixtures: X-Ray Powder Diffraction Versus Quasi-Kinematic Transmission Electron Microscopy, Peter Moeck Mar 2008

Structural Identification Of Cubic Iron-Oxide Nanocrystal Mixtures: X-Ray Powder Diffraction Versus Quasi-Kinematic Transmission Electron Microscopy, Peter Moeck

Physics Faculty Publications and Presentations

Two novel (and proprietary) strategies for the structural identification of a nanocrystal from either a single high-resolution (HR) transmission electron microscopy (TEM) image or a single precession electron diffraction pattern are proposed and their advantages discussed in comparison to structural fingerprinting from powder X-ray diffraction patterns. Simulations for cubic magnetite and maghemite nanocrystals are used as examples.


Transmission Electron Goniometry And Its Relation To Electron Tomography For Materials Science Apoplications, Peter Moeck, P. Fraundorf Nov 2006

Transmission Electron Goniometry And Its Relation To Electron Tomography For Materials Science Apoplications, Peter Moeck, P. Fraundorf

Physics Faculty Publications and Presentations

Aspects of transmission electron goniometry are discussed. Combined with high resolution phase contrast transmission electron microscopy (HRTEM) and atomic resolution scanning TEM (STEM) in the atomic number contrast (Z-STEM) or the phase contrast bright field mode, transmission electron goniometry offers the opportunity to develop dedicated methods for the crystallographic characterization of nanocrystals in three dimensions. The relationship between transmission electron goniometry and electron tomography for materials science applications is briefly discussed. Internet based java applets that facilitate the application of transmission electron goniometry for cubic crystals with calibrated tilt-rotation and double-tilt specimen holders/goniometers are mentioned. The so called cubic-minimalistic ...