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Full-Text Articles in Physics
Combining Atomic Force Microscopy And Shear-Force Acoustic Near-Field Microscopy To Characterize Confined Mesoscopic Fluids, Monte Allen Kozell, Theodore Brockman, Andres H. La Rosa
Combining Atomic Force Microscopy And Shear-Force Acoustic Near-Field Microscopy To Characterize Confined Mesoscopic Fluids, Monte Allen Kozell, Theodore Brockman, Andres H. La Rosa
Physics Faculty Publications and Presentations
An atomic force microscopy (AFM) cantilever is integrated into to a quartz tuning fork (QTF) to probe the viscoelastic properties of mesoscopic fluid layers confined between two solid surfaces under shear. Two procedures to fabricate the AFM/QTF probe are described herein. In the first, a nano-manipulator is used to transport a commercially available afm cantilever from its chip holder to the edge of a QTF tine. In the second, an afm cantilever is fabricated at the edge of the QTF tine itself. In both cases we exploit the capabilities of a dual-beam system (focused ion beam/scanning electron microscope), equipped with …
Confined Fluid Analyzed With Near-Field Acoustic Detection, Rodolfo Fernandez Rodriguez, Theodore Brockman, J. Bai, Andres H. La Rosa
Confined Fluid Analyzed With Near-Field Acoustic Detection, Rodolfo Fernandez Rodriguez, Theodore Brockman, J. Bai, Andres H. La Rosa
Physics Faculty Publications and Presentations
Measurement of the damping and elastic interactions between two solids interfaces (one being the apex of a tapered probe that is attached to one tine of a quartz tuning fork while the other is a flat substrate) under relative lateral oscillatory motion are reported. The solid boundaries are separated by a nanometer sized gap, and emphasis is placed on the role played by the mesoscopic fluid trapped in between. The measurements were implemented using two new acoustic techniques that have been integrated into a tuning fork based scanning probe microscope; the whole metrology system offers sub-nanometer precision for controlling the …
Finite Element Method Analysis Of Whispering Gallery Acoustic Sensing, T. Le, H. Tran, Rodolfo Fernandez Rodriguez, C.J. Solano Salinas, Nima Laal, R. Bringas, J. Quispe, F. Segundo, Andres H. La Rosa
Finite Element Method Analysis Of Whispering Gallery Acoustic Sensing, T. Le, H. Tran, Rodolfo Fernandez Rodriguez, C.J. Solano Salinas, Nima Laal, R. Bringas, J. Quispe, F. Segundo, Andres H. La Rosa
Physics Faculty Publications and Presentations
Whispering Gallery Acoustic Sensing (WGAS) has recently been introduced as a sensing feedback mechanism to control the probe-sample separation distance in scanning probe microscopy that uses a quartz tuning fork as a sensor (QTF-SPM). WGAS exploits the SPM supporting frame as a resonant acoustic cavity to monitor the nanometer-sized amplitude of the QTF oscillations. Optimal WGAS sensitivity depends on attaining an exact match between the cavity's frequency peak response and the TF resonance frequency. However, two aspects play against this objective: i) the unpredictable variability of the TF resonance frequency (upon attaching a SPM-probe to one of its tines), …
Probe Damage Evaluation In Frequency-Modulation Shear-Force Acoustic Near-Field Microscopy, Theodore Brockman, Rodolfo Fernandez Rodriguez, J. Bai, Monte Allen Kozell, Andres H. La Rosa
Probe Damage Evaluation In Frequency-Modulation Shear-Force Acoustic Near-Field Microscopy, Theodore Brockman, Rodolfo Fernandez Rodriguez, J. Bai, Monte Allen Kozell, Andres H. La Rosa
Physics Faculty Publications and Presentations
Shear-force acoustic near-field microscopy (SANM) and Whispering Gallery Acoustic Sensing have recently been introduced as a tandem system to characterize the viscoelastic response of fluids confined between two solid-boundaries in relative oscillatory lateral motion. SANM uses a) a laterally oscillating tapered probe (attached to a quartz tuning fork QTF) as one of the trapping boundaries, and b) an acoustic sensor (attached to the other flat-substrate boundary) that independently monitors the fluid’s acoustic emission. On the other and, WGAS is another technique that uses an acoustic transducer (attached to the frame holding the probe) to monitor the probe’s lateral motion amplitude. …
Instrumentation-Level Improvements In Shear-Force Near-Field Acoustic Microscopy, J. Bai, P. Devulapalli, Theodore Brockman, Andres H. La Rosa
Instrumentation-Level Improvements In Shear-Force Near-Field Acoustic Microscopy, J. Bai, P. Devulapalli, Theodore Brockman, Andres H. La Rosa
Physics Faculty Publications and Presentations
The recently introduced Shear-force Near-field Acoustic Microscopy (SANM) brings a new sensing mechanism to the scanning probe microscopy family. SANM's ability to simultaneously monitor, in real time, several physical sample's responses presents some challenges for ensuring optimal operation; namely, avoid "cross-talk" among the multiple signals, address the compensation of thermal drift to ensure reproducibility of the measurements, and measuring the typical low-level signals obtained from nanometer-sized tested regions. Here, several improvements relevant to SANM, but valid for SPM in general, are addressed. i) The probe's coarse approach is performed via stepper motors, which are controlled either by a computer …
Photonic Near-Field Imaging In Multiphoton Photoemission Electron Microscopy, Joseph Fitzgerald, Robert Campbell Word, S. D. Saliba, Rolf Kӧnenkamp
Photonic Near-Field Imaging In Multiphoton Photoemission Electron Microscopy, Joseph Fitzgerald, Robert Campbell Word, S. D. Saliba, Rolf Kӧnenkamp
Physics Faculty Publications and Presentations
We report the observation of optical near fields in a photonic waveguide of conductive indium tin oxide (ITO) using multiphoton photoemission electron microscopy (PEEM). Nonlinear two-photon photoelectron emission is enhanced at field maxima created by interference between incident 410-nm and coherently excited guided photonic waves, providing strong phase contrast. Guided modes are observed under both transverse magnetic field (TM) and transverse electric field (TE) polarized illuminations and are consistent with classical electromagnetic theory. Implications on the role of multiphoton PEEM in optical near-field imaging are discussed.
Acousto Characterization Of Fluid-Like Mesoscopic Films Under Shear, Rodolfo Fernandez, Xiaohua Wang, Andres H. La Rosa
Acousto Characterization Of Fluid-Like Mesoscopic Films Under Shear, Rodolfo Fernandez, Xiaohua Wang, Andres H. La Rosa
Physics Faculty Publications and Presentations
Full understanding of the physics underlying the striking changes-in viscoelasticity, relaxation time, and phase transitions-that mesoscopic fluid-like systems undergo when placed under confinement or when adsorbed at solid surfaces constitutes a long standing scientific challenge. One of the methods used to characterize these films consists of bringing a solid boundary closer to another solid boundary (while in relative lateral periodic motion) with a liquid trapped in between. In addition, using a tapered probe (~ 50 nm apex diameter) as one of the boundaries improves the lateral resolution of the measurement. In this scenario, the dynamics of the fluid is inferred …
The Ultrasonic/Shear-Force Microscope: Integrating Ultrasonic Sensing Into A Near-Field Scanning Optical Microscope, Andres H. La Rosa, Xiquan Cui, J. Mccollum, Nan Li, Richard Nordstrom
The Ultrasonic/Shear-Force Microscope: Integrating Ultrasonic Sensing Into A Near-Field Scanning Optical Microscope, Andres H. La Rosa, Xiquan Cui, J. Mccollum, Nan Li, Richard Nordstrom
Physics Faculty Publications and Presentations
An ultrasonic transducer is incorporated into a near-field scanning optical microscope (NSOM) to augment its versatility to characterize the properties of layers adsorbed to a sample's surface. Working under typical NSOM operation conditions, the ultrasonic transducer--attached underneath the sample--demonstrates sufficient sensitivity to monitor the waves generated by the tapered NSOM probe that oscillates in the proximity of, and parallel to, the sample's top surface. This capability makes the newly integrated ultrasonic/shear-force microscope a valuable diagnostic tool in the study of sliding friction and surface phenomena in general. Here, it is used to concurrently and independently monitor the effects that probe-sample …
A Compact Method For Optical Induction Of Proximal Probe Heating And Elongation, Andres H. La Rosa, Hans D. Hallen
A Compact Method For Optical Induction Of Proximal Probe Heating And Elongation, Andres H. La Rosa, Hans D. Hallen
Physics Faculty Publications and Presentations
A tapered, metal-coated, optical fiber probe will elongate when heated by light input through a fiber. The induced motion can be used for data storage or nanostructuring of a surface. The elongation produced by this alignment-free system is measured with force feedback in a near-field scanning optical microscope (NSOM). The input light intensity controls the elongation magnitude, which ranges from a few nanometers to more than 100 nm. A 0.5-mW input energy yields ~20 nm of probe elongation. The elongation quantified here can create artifacts in any experiment using pulsed laser light with a NSOM or an atomic force microscope.
Optical Imaging Of Carrier Dynamics In Silicon With Subwavelength Resolution, Andres H. La Rosa, B. I. Yakobson, H. D. Hallen
Optical Imaging Of Carrier Dynamics In Silicon With Subwavelength Resolution, Andres H. La Rosa, B. I. Yakobson, H. D. Hallen
Physics Faculty Publications and Presentations
Characteristic rate variations of carrier processes are imaged using near-field scanning optical microscopy. We couple both a visible pump and an infrared probe light through a subwavelength aperture to investigate the interband recombination and intraband diffusion of excess carriers in oxidized silicon. Typical values of the locally measured life time constants agree well with those obtained by conventional space-averaged techniques. Moreover, the images locate defects, reveal variations, and can map the regions in which a recombination process is active.
Single Molecule Emission Characteristics In Near-Field Microscopy, Randy X. Bian, Robert C. Dunn, X. Sunney Xie, P.T. Leung
Single Molecule Emission Characteristics In Near-Field Microscopy, Randy X. Bian, Robert C. Dunn, X. Sunney Xie, P.T. Leung
Physics Faculty Publications and Presentations
In near-field scanning optical microscopy (NSOM), the measured fluorescence lifetime of a single dye molecule can be shortened or lengthened, sensitively dependent on the relative position between the molecule and aluminum coated fiber tip. The modified lifetimes and other emission characteristics are simulated by solving Maxwell equations with the finite-difference time-domain (FDTD) method. The 2D computation reveals insight into the lifetime behaviors and provides guidance for nonperturbative spectroscopic measurements with NSOM. This new methodology is capable of predicting molecular emission properties in front of a metal/dielectric interface of arbitrary geometry.
Origins And Effects Of Thermal Processes On Near-Field Optical Probes, Andres H. La Rosa, B. I. Yakobson, H. D. Hallen
Origins And Effects Of Thermal Processes On Near-Field Optical Probes, Andres H. La Rosa, B. I. Yakobson, H. D. Hallen
Physics Faculty Publications and Presentations
An aluminum-coated tapered fiber probe, as used in near-field scanning optical microscopy (NSOM), is heated by the light coupled into it. This can destroy the probe or may modify the sample, which can be problematic or used as a tool. To study these thermal effects, we couple modulated visible light of various power through probes. Simultaneously coupled infrared light senses the thermal effects. We report their magnitude, their spatial and temporal scales, and real-time probe damage observations.Amodel describes the experimental data, the mechanisms for induced IR variation, and their relative importance.