Open Access. Powered by Scholars. Published by Universities.®
- Keyword
-
- (HI (1)
- CMOS (1)
- CMOS Integrated Circuits (1)
- Compounds (1)
- Cosmic Ray Apparatus (1)
-
- Detectors (1)
- Displacement Damage (1)
- Energy Loss of Particles (1)
- Fragmentation (1)
- High-Energy Heavy Ions (1)
- Integrated Circuit Testing (1)
- Ion Beam Effects (1)
- Ionizing Radiation (1)
- MOSFET (1)
- NIEL Calculations (1)
- Nanolithography (1)
- Nanoparticles (1)
- Nanostructures (1)
- Nonionizing Energy Loss (1)
- Particle Detectors (1)
- Photolithography (1)
- Polypyrrole (1)
- Radiation Environment (1)
- Radiation Hardening (Electronics) (1)
- Radiation Resistance Testing (1)
- Radiation-Induced Damage (1)
- Risk Management (1)
- Safety Factor Margins (1)
- Semiconductor Device Testing (1)
- Semiconductor Quantum Dots (1)
Articles 1 - 4 of 4
Full-Text Articles in Physics
Nanometal Containing Nanocomposites And Photolithographic Polyaniline Nanofibers, Frank D. Blum, Sunil K. Pillalamarri, Lalani K. Werake, J. Greg Story, Massimo F. Bertino, Akira Tokuhiro
Nanometal Containing Nanocomposites And Photolithographic Polyaniline Nanofibers, Frank D. Blum, Sunil K. Pillalamarri, Lalani K. Werake, J. Greg Story, Massimo F. Bertino, Akira Tokuhiro
Chemistry Faculty Research & Creative Works
A report on recent progress from our laboratories on the nanostructures produced from novel synthesis techniques will be discussed. Using high-energy radiation (γ-rays) we have been able to produce conducting polymer nanofibers and nanorods of polyaniline and polypyrrole without the use of a separate template or capping agent. This technique has been extended, with the addition of metal ions, to a "one pot" synthesis, producing conducting nanocomposites. These nanocomposites contain metal nanoparticles which decorate the conducting nanofibers. We have also recently shown that these systems can be photopatterned to produce novel structures. We believe that these systems will be useful …
Niel Calculations For High-Energy Heavy Ions, John W. Wilson, I. Jun, M. A. Xapsos, E. A. Burke, F. F. Badavi, L. W. Townsend
Niel Calculations For High-Energy Heavy Ions, John W. Wilson, I. Jun, M. A. Xapsos, E. A. Burke, F. F. Badavi, L. W. Townsend
Nuclear Engineering and Radiation Science Faculty Research & Creative Works
Calculations of NIEL are reported for heavy ions prominent in the space environment for energies ranging from 200 MeV per nucleon to 2 GeV per nucleon.
Laser Writing Of Semiconductor Nanoparticles And Quantum Dots, Massimo F. Bertino, Raghuveer Reddy Gadipalli, J. Greg Story, C. G. Williams, Guo-Hui Zhang, Chariklia Sotiriou-Leventis, Akira Tokuhiro, Suchi Guha, Nicholas Leventis
Laser Writing Of Semiconductor Nanoparticles And Quantum Dots, Massimo F. Bertino, Raghuveer Reddy Gadipalli, J. Greg Story, C. G. Williams, Guo-Hui Zhang, Chariklia Sotiriou-Leventis, Akira Tokuhiro, Suchi Guha, Nicholas Leventis
Physics Faculty Research & Creative Works
Silica aerogels were patterned with CdS using a photolithographic technique based on local heating with infrared (IR) light. The solvent of silica hydrogels was exchanged with an aqueous solution of the precursors CdNO3 and NH4 OH, all precooled to a temperature of 5°C. Half of the bathing solution was then replaced by a thiourea solution. After thiourea diffused into the hydrogels, the samples were exposed to a focused IR beam from a continuous wave, Nd-YAG laser. The precursors reacted in the spots heated by the IR beam to form CdS nanoparticles. We lithographed features with a diameter of …
Radiation Resistance Testing Of Mosfet And Cmos As A Means Of Risk Management, Akira Tokuhiro, Massimo F. Bertino
Radiation Resistance Testing Of Mosfet And Cmos As A Means Of Risk Management, Akira Tokuhiro, Massimo F. Bertino
Nuclear Engineering and Radiation Science Faculty Research & Creative Works
Whether for military, research (space, accelerator physics) and/or civilian use, risk avoidance against radiation-induced damage is not possible with COTS parts. Thus the sensible approach is risk management. We recommend a sensible risk management approach as follows: 1) know the radiation environment of the intended application to the extent possible; 2) know the effects of ionizing radiation on the component(s) of interest; 3) know the requirements of the application; 4) identify the candidate or chosen components; 5) test the components; 6) design-in safety factor margins to the extent possible.