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Articles 1 - 2 of 2

Full-Text Articles in Physics

Electronic And Structural Properties Of Molybdenum Thin Films As Determined By Real Time Spectroscopic Ellipsometry, J. D. Walker, H. Khatri, V. Ranjan, Jian Li, R. W. Collins, S. Marsillac Jan 2009

Electronic And Structural Properties Of Molybdenum Thin Films As Determined By Real Time Spectroscopic Ellipsometry, J. D. Walker, H. Khatri, V. Ranjan, Jian Li, R. W. Collins, S. Marsillac

Electrical & Computer Engineering Faculty Publications

Walker, J.D., Khatri, H., Ranjan, V., Li, J., Collins, R.W., & Marsillac, S. (2009). Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry. Applied Physics Letters, 94(14). doi: 10.1063/1.3117222


X-Ray Generation From Metal Targets Coated With Wavelength-Scale Spheres, D. R. Symes, H. A. Sumeruk, I. V. Churina, Thomas D. Donnelly, J. Landry, T. Ditmire May 2005

X-Ray Generation From Metal Targets Coated With Wavelength-Scale Spheres, D. R. Symes, H. A. Sumeruk, I. V. Churina, Thomas D. Donnelly, J. Landry, T. Ditmire

All HMC Faculty Publications and Research

X-ray yield measurements from targets coated with wavelength-scale spheres are compared with measurements from polished targets. Evidence for a hotter resonant electron temperature due to field enhancements from Mie resonances in the spheres is investigated.