Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 3 of 3
Full-Text Articles in Physics
Phase Imaging: Deep Or Superficial?, Nancy Burnham, O Behrend, L Odoni, J Loubet
Phase Imaging: Deep Or Superficial?, Nancy Burnham, O Behrend, L Odoni, J Loubet
Nancy A. Burnham
Phase images acquired while intermittently contacting a sample surface with the tip of an atomic force microscope cantilever are not easy to relate to material properties. We have simulated dynamic force curves and compared simulated with experimental results. For some cantilever–sample combinations, the interaction remains a surface effect, whereas for others, the tip penetrates the sample significantly. Height artifacts in the “topography” images, and the role of the sample stiffness, work of adhesion, damping, and topography in the cantilever response manifest themselves to different extents depending on the indentation depth.
Materials’ Properties Measurements: Choosing The Optimal Scanning Probe Microscope Configuration, Nancy Burnham, G Gremaud, A Kulik, P Gallo, F Oulevey
Materials’ Properties Measurements: Choosing The Optimal Scanning Probe Microscope Configuration, Nancy Burnham, G Gremaud, A Kulik, P Gallo, F Oulevey
Nancy A. Burnham
Rheological models are used to represent different scanning probe microscope configurations. The solutions for their static and dynamic behavior are found and used to analyze which scanning probe microscope configuration is best for a given application. We find that modulating the sample at high frequencies results in the best microscope behavior for measuring the stiffness of rigid materials, and that by modulating the tip at low frequencies and detecting the motion of the tip itself (not its position relative to the tip holder) should be best for studying compliant materials in liquids.
Interpretation Issues In Force Microscopy, Nancy Burnham, Richard Colton, Hubert Pollock
Interpretation Issues In Force Microscopy, Nancy Burnham, Richard Colton, Hubert Pollock
Nancy A. Burnham
In this paper, we will discuss force microscopy (FM) and its potential for determining mechanical properties of thin films. We will introduce the basic principles of FM, and demonstrate how FM can be used to determine materials properties as well as image surface topography, both with nanonewton or sub‐nanonewton force resolution and sub‐nanometer position resolution. As FM is still a new field, not all of the questions concerning interpretation have been fully answered. We will elucidate four current issues that must be resolved before the full potential of FM can be realized. They are: (1) the role of water vapor …