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Phase Imaging: Deep Or Superficial?, Nancy Burnham, O Behrend, L Odoni, J Loubet
Phase Imaging: Deep Or Superficial?, Nancy Burnham, O Behrend, L Odoni, J Loubet
Nancy A. Burnham
Phase images acquired while intermittently contacting a sample surface with the tip of an atomic force microscope cantilever are not easy to relate to material properties. We have simulated dynamic force curves and compared simulated with experimental results. For some cantilever–sample combinations, the interaction remains a surface effect, whereas for others, the tip penetrates the sample significantly. Height artifacts in the “topography” images, and the role of the sample stiffness, work of adhesion, damping, and topography in the cantilever response manifest themselves to different extents depending on the indentation depth.
Apparent And True Feature Heights In Force Microscopy, Nancy Burnham
Apparent And True Feature Heights In Force Microscopy, Nancy Burnham
Nancy A. Burnham
In a force microscope, the stiffness of the cantilever beam convolutes with the tip‐sample interaction stiffness to influence the data in a systematic way. The analysis presented here relates the measured feature height to the true feature height in the variable force, constant force, and constant force gradient modes of operation. In this way, one can understand previously published data: the enhanced measured atomic corrugation observed in high resolution force microscopy images, its increase with load, and the improved resolution of lateral force images. The correct interaction stiffness can be obtained for use in surface force and mechanical properties studies. …