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Unusual Perpendicular Anisotropy In Co2Tisi Films, Yunlong Jin, Shah R. Valloppilly, Parashu R. Kharel, Rohit Pathak, Arti Kashyap, Ralph Skomski, David J. Sellmyer

David Sellmyer Publications

Thin films of Co₂TiSi on MgO are investigated experimentally and theoretically. The films were produced by magnetron sputtering on MgO(001) and have a thickness of about 100 nm. As bulk Co₂TiSi, they crystallize in the normal cubic Heusler (L2₁) structure, but the films are slightly distorted (c/a = 1.0014) and contain some antisite disorder. The films exhibit a robust perpendicular anisotropy of 0.5 MJ m⁻³. This result is surprising for several reasons. First, surface and interface anisotropies are too small to explain perpendicular anisotropy in such rather thick …