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Mfm Studies Of Interlayer Exchange Coupling In Co/Ru/Co Films: Effect Of Ru Layer Thickness, Lanping Yue, Zhen Li, Roger D. Kirby, David J. Sellmyer

David Sellmyer Publications

Antiferromagnetically coupled magnetic thin films are promising candidates for the design of new magnetic storage and logic devices. The ability to control the interlayer thickness, therefore the magnetic reversal response, of exchange-coupled magnetic layers is of paramount importance in nanotechnology, especially in magnetic sensing element design and applications. In this work, magnetic force microscopy (MFM) with improved sensitivity and high spatial resolution probes was used to obtain a more detailed view of magnetization reversal behavior and domain evolution in the indirect exchange-coupled trilayer system: Co/Ru/Co. The effect of the variable Ru interlayer thickness on the exchange coupling and thus the …