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Christian Binek Publications

Oxides

Publication Year

Articles 1 - 2 of 2

Full-Text Articles in Physics

Space-Charge Limited Conduction In Epitaxial Chromia Films Grown On Elemental And Oxide-Based Metallic Substrates, C.-P. Kwan, Mike Street, Ather Mahmood, Will Echtenkamp, M. Randle, K. He, J. Nathawat, N. Arabchigavkani, B. Barut, S. Yin, R. Dixit, Uttam Singisetti, Christian Binek, J. P. Bird May 2019

Space-Charge Limited Conduction In Epitaxial Chromia Films Grown On Elemental And Oxide-Based Metallic Substrates, C.-P. Kwan, Mike Street, Ather Mahmood, Will Echtenkamp, M. Randle, K. He, J. Nathawat, N. Arabchigavkani, B. Barut, S. Yin, R. Dixit, Uttam Singisetti, Christian Binek, J. P. Bird

Christian Binek Publications

We study temperature dependent (200 – 400 K) dielectric current leakage in high-quality, epitaxial chromia films, synthesized on various conductive substrates (Pd, Pt and V2O3). We find that trap-assisted space-charge limited conduction is the dominant source of electrical leakage in the films, and that the density and distribution of charge traps within them is strongly dependent upon the choice of the underlying substrate. Pd-based chromia is found to exhibit leakage consistent with the presence of deep, discrete traps, a characteristic that is related to the known properties of twinning defects in the material. The Pt- and V2O3-based films, in contrast, show ...


Dielectric Properties Of Thin Cr2o3 Films Grown On Elemental And Oxide Metallic Substrates, Ather Mahmood, Mike Street, Will Echtenkamp, Chun Pui Kwan, Jonathan P. Bird, Christian Binek Apr 2018

Dielectric Properties Of Thin Cr2o3 Films Grown On Elemental And Oxide Metallic Substrates, Ather Mahmood, Mike Street, Will Echtenkamp, Chun Pui Kwan, Jonathan P. Bird, Christian Binek

Christian Binek Publications

In an attempt to optimize leakage characteristics of α-Cr2O3 thin films, its dielectric properties were investigated at local and macroscopic scale. The films were grown on Pd(111), Pt(111), and V2O3 (0001), supported on Al2O3 substrate. The local conductivity was measured by conductive atomic force microscopy mapping of Cr2O3 surfaces, which revealed the nature of defects that formed conducting paths with the bottom Pd or Pt layer. A strong correlation was found between these electrical defects and the grain boundaries revealed in the corresponding topographic scans ...