Open Access. Powered by Scholars. Published by Universities.®
Articles 1 - 3 of 3
Full-Text Articles in Physics
Voltage Controlled Magnetism In Cr2o3 Based All-Thin-Film Systems, Junlei Wang, Will Echtenkamp, Ather Mahmood, Christian Binek
Voltage Controlled Magnetism In Cr2o3 Based All-Thin-Film Systems, Junlei Wang, Will Echtenkamp, Ather Mahmood, Christian Binek
Christian Binek Publications
Voltage-control of exchange biases through active selection of distinct domain states of the magnetoelectric and antiferromagnetic pinning layer is demonstrated for Cr2O3/CoPd heterostructures. Progress and obstacles towards an isothermal switching of exchange bias are discussed. An alternative approach avoiding exchange bias for voltage-controlled memory exploits boundary magnetization at the surface of Cr2O3 as voltage-controlled state variable. We demonstrate readout and switching of boundary magnetization in ultra-thin Cr2O3/Pt Hall bar devices where reversal of boundary magnetization is achieved via magnetoelectric annealing with simultaneously applied ±0.5 V and 400 mT electric and magnetic fields.
Space-Charge Limited Conduction In Epitaxial Chromia Films Grown On Elemental And Oxide-Based Metallic Substrates, C.-P. Kwan, Mike Street, Ather Mahmood, Will Echtenkamp, M. Randle, K. He, J. Nathawat, N. Arabchigavkani, B. Barut, S. Yin, R. Dixit, Uttam Singisetti, Christian Binek, J. P. Bird
Space-Charge Limited Conduction In Epitaxial Chromia Films Grown On Elemental And Oxide-Based Metallic Substrates, C.-P. Kwan, Mike Street, Ather Mahmood, Will Echtenkamp, M. Randle, K. He, J. Nathawat, N. Arabchigavkani, B. Barut, S. Yin, R. Dixit, Uttam Singisetti, Christian Binek, J. P. Bird
Christian Binek Publications
We study temperature dependent (200 – 400 K) dielectric current leakage in high-quality, epitaxial chromia films, synthesized on various conductive substrates (Pd, Pt and V2O3). We find that trap-assisted space-charge limited conduction is the dominant source of electrical leakage in the films, and that the density and distribution of charge traps within them is strongly dependent upon the choice of the underlying substrate. Pd-based chromia is found to exhibit leakage consistent with the presence of deep, discrete traps, a characteristic that is related to the known properties of twinning defects in the material. The Pt- and V2O3-based films, in contrast, …
Dielectric Properties Of Thin Cr2o3 Films Grown On Elemental And Oxide Metallic Substrates, Ather Mahmood, Mike Street, Will Echtenkamp, Chun Pui Kwan, Jonathan P. Bird, Christian Binek
Dielectric Properties Of Thin Cr2o3 Films Grown On Elemental And Oxide Metallic Substrates, Ather Mahmood, Mike Street, Will Echtenkamp, Chun Pui Kwan, Jonathan P. Bird, Christian Binek
Christian Binek Publications
In an attempt to optimize leakage characteristics of α-Cr2O3 thin films, its dielectric properties were investigated at local and macroscopic scale. The films were grown on Pd(111), Pt(111), and V2O3 (0001), supported on Al2O3 substrate. The local conductivity was measured by conductive atomic force microscopy mapping of Cr2O3 surfaces, which revealed the nature of defects that formed conducting paths with the bottom Pd or Pt layer. A strong correlation was found between these electrical defects and the grain boundaries revealed in the corresponding topographic scans. In comparison, …