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Spectral Densities Of Embedded Interfaces In Composite Materials, A. R. Mcgurn, Anthony Roy Day, D. J. Bergman, L. C. Davis, M. F. Thorpe
Spectral Densities Of Embedded Interfaces In Composite Materials, A. R. Mcgurn, Anthony Roy Day, D. J. Bergman, L. C. Davis, M. F. Thorpe
Anthony Roy Day
The effective resistivity and conductivity of two media that meet at a randomly rough interface are computed in the quasistatic limit. The results are presented in the spectral density representations of the Bergman-Milton formulation for the properties of two-component composite materials. The spectral densities are extracted from computer simulations of resistor networks in which the random interface separates two regions containing different types of resistors. In the limit that the bond lengths in the resistor network are small compared to parameters characterizing the surface roughness, the resistor network simulation approximates the continuum limit of the two-component composite. The Bergman-Milton formulation …