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T. -C. Shen

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Ion Irradiation Effects On Graphite With Scanning Tunneling Microscope, T. -C. Shen, R. T. Brockenbrough, J. R. Tucker, J. W. Lyding Jan 1991

Ion Irradiation Effects On Graphite With Scanning Tunneling Microscope, T. -C. Shen, R. T. Brockenbrough, J. R. Tucker, J. W. Lyding

T. -C. Shen

Scanning tunneling microscope is used to create local surface modifications by means of ion impact damage. Graphite has been used as a test case to demonstrate this local surface sputtering. Using 0.1-µs voltage pulse of - 30 to - 140 V applied to the sample in a rough vacuum of 10-2 Torr, a confined area of damage (typically about 100 Å in diameter) is usually obtained. The damaged area consists of several layers of terraces. Defects of the size of a few atoms can also be found. Electronic perturbations caused by defects can form superlattices with a spacing three times …