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Full-Text Articles in Physics
Electron Emission And Transport Properties Database For Spacecraft Charging Models, Phil Lundgreen
Electron Emission And Transport Properties Database For Spacecraft Charging Models, Phil Lundgreen
Theses and Dissertations
Modeling the rate and likelihood of spacecraft charging during spacecraft mission is critical to determine mission length, proposed spacecraft attitude, and spacecraft design. The focus of this work is the creation and utilization of a database of secondary electron yield (SEY) measurements for a host of materials to increase accuracy in spacecraft modeling. Traditional methods of SEY data selection for input into spacecraft charging codes typically include the use of compiled materials databases incorporated in charging codes or selecting values from a specific scientific study. The SEY database allows users to select data inputs based upon the details associated with …
Studies On Secondary Electron Emission Induced Charging In Dielectric Materials: Novel Methods And Applications For Space And Plasma Technologies, Leandro Olano Garcia
Studies On Secondary Electron Emission Induced Charging In Dielectric Materials: Novel Methods And Applications For Space And Plasma Technologies, Leandro Olano Garcia
Theses and Dissertations
The interaction of ionizing radiation with matter is of critical importance in many areas of science and technology such as space and plasma technology. Secondary electron emission is a direct consequence of electron irradiation on materials. To characterize materials in terms of secondary electron emission, the secondary emission yield (SEY) and the energy spectra of the secondary electrons are key physical properties. Secondary emission yields of materials are usually too high to avoid Multipactor effect or other related phenomena in applications for space. In addition, the measurement of electron energy spectra of secondary electrons in dielectric materials is a challenge …
Suppresion Of Electron Yield With Carbon Nanotube Forests: A Case Study, Brian Wood, Jordan Lee, Gregory Wilson, T.-C. Shen, Jr Dennison
Suppresion Of Electron Yield With Carbon Nanotube Forests: A Case Study, Brian Wood, Jordan Lee, Gregory Wilson, T.-C. Shen, Jr Dennison
Conference Proceedings
Electron emission of carbon nanotube (CNT) forests grown on silicon substrates was measured to investigate possible electron yield suppression due to the composition and morphology of CNT forests. CNT forests are vertically-oriented tubular formations of graphitic carbon grown on a substrate; these have been widely investigated for their extreme properties in optical, electrical, and mechanical aspects of physics and material sciences. CNT coatings are good candidates for yield reduction, in analogy with the near-ideal blackbody optical properties of CNT forests. Carbon with its low atomic number has an inherent low yield due to its low density of bulk electrons. Furthermore, …
Hemispherical Grid Retarding Field Analyzer Redesign For Secondary Electron Emission Studies, Greg Wilson, Jr Dennison
Hemispherical Grid Retarding Field Analyzer Redesign For Secondary Electron Emission Studies, Greg Wilson, Jr Dennison
Presentations
A redesign of the Hemispherical Grid Retarding Field Analyzer is discussed in relationship to multilayer charging models. In order to accurately extend single layer charging models to dynamic multilayer scenarios, precise measurements of electron emission as well as the net surface potential must be made. By learning from the previous design and thinking of future applications, the new instrument will greatly enhance our ability to precisely measure materials undergoing energetic electron bombardment.
Hemispherical Grid Retarding Field Analyzer Redesign For Secondary Electron Emission Studies, Greg Wilson, Jr Dennison
Hemispherical Grid Retarding Field Analyzer Redesign For Secondary Electron Emission Studies, Greg Wilson, Jr Dennison
Conference Proceedings
A redesign of the Hemispherical Grid Retarding Field Analyzer is discussed in relationship to multilayer charging models. In order to accurately extend single layer charging models to dynamic multilayer scenarios, precise measurements of electron emission as well as the net surface potential must be made. By learning from the previous design and thinking of future applications, the new instrument will greatly enhance our ability to precisely measure materials undergoing energetic electron bombardment.