Physics Commons^™

Dielectric Properties Of Thin Cr2o3 Films Grown On Elemental And Oxide Metallic Substrates, Ather Mahmood, Mike Street, Will Echtenkamp, Chun Pui Kwan, Jonathan P. Bird, Christian Binek

Christian Binek Publications

In an attempt to optimize leakage characteristics of α-Cr₂O₃ thin films, its dielectric properties were investigated at local and macroscopic scale. The films were grown on Pd(111), Pt(111), and V₂O₃ (0001), supported on Al₂O₃ substrate. The local conductivity was measured by conductive atomic force microscopy mapping of Cr₂O₃ surfaces, which revealed the nature of defects that formed conducting paths with the bottom Pd or Pt layer. A strong correlation was found between these electrical defects and the grain boundaries revealed in the corresponding topographic scans. In comparison, …