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Nanoscale Investigation Of Fatigue Effects In Pb(Zr,Ti)O3 Films, Alexei Gruverman, O. Auciello, H. Tokumoto
Nanoscale Investigation Of Fatigue Effects In Pb(Zr,Ti)O3 Films, Alexei Gruverman, O. Auciello, H. Tokumoto
Alexei Gruverman Publications
Scanning force microscopy has been used to perform a comparative nanoscale study of domain structures and switching behavior of Pb(ZrxTi1-x)O3 (PZT) thin films integrated into heterostructures with different electrodes. The study revealed a significant difference between polarization state of as-deposited PZT films on RuO2 and Pt electrodes. The PZT/RuO2 films exhibit polydomain crystallites and show almost symmetric switching behavior, while the PZT/Pt films are mainly in a single polarity state and exhibit highly asymmetric piezoelectric hysteresis loops. Formation of unswitchable polarization within the grains of submicron size as a result of fatigue process …
Scanning Force Microscopy For The Study Of Domain Structure In Ferroelectric Thin Films, Alexei Gruverman, O. Auciello, H. Tokumoto
Scanning Force Microscopy For The Study Of Domain Structure In Ferroelectric Thin Films, Alexei Gruverman, O. Auciello, H. Tokumoto
Alexei Gruverman Publications
A piezoresponse technique based on scanning force microscopy (SFM) has been used for studying domain structure in ferroelectric thin films. Studies were performed on Pb(Zrx,Ti1-x)O3(PZT) thin films produced by a sol–gel method. The piezoresponse images of the PZT films were taken before and after inducing polarization in the films by applying a direct current voltage between the bottom electrode and the SFM tip. Polarization induced patterns were written with 20 V pulses and subsequently imaged by the SFM piezoresponse technique. The effect of the film structure on the imaging resolution of domains is discussed.