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University of Nebraska - Lincoln

1995

Si-Hwang Liou Publications

Articles 1 - 2 of 2

Full-Text Articles in Physics

High Resolution Electron Microscopy And Nano-Probe Study Of Cosm/Cr Films, Yi Liu, David J. Sellmyer, B. W. Robertson, Z.S. Shan, Sy_Hwang Liou Nov 1995

High Resolution Electron Microscopy And Nano-Probe Study Of Cosm/Cr Films, Yi Liu, David J. Sellmyer, B. W. Robertson, Z.S. Shan, Sy_Hwang Liou

Si-Hwang Liou Publications

The crystal structure of the crystallites in CoSm thin films deposited on Cr underlayer was studied by nanodiffraction and high resolution electron microscopy (HREM). It was found that the crystallites have a closed-packed structure. Some nanodiffraction patterns taken from different crystallites using a two nanometer probe can be indexed by two layer stacking AB (HCP structure), three layer stacking ABC (FCC structure), and four layer stacking ABAC (double hexagonal structure), suggesting that a particular local stacking mode could exist. [112-0] HREM images confirmed that stacking sequence changes within one crystallite. In local regions, random stacking, and unit cells of ...


Microstructure Of The Cr Underlayer And Its Effect On Sm-Co//Cr Thin Films, Yi Liu, B. W. Robertson, Z.S. Shan, Sy_Hwang Liou, David J. Sellmyer Apr 1995

Microstructure Of The Cr Underlayer And Its Effect On Sm-Co//Cr Thin Films, Yi Liu, B. W. Robertson, Z.S. Shan, Sy_Hwang Liou, David J. Sellmyer

Si-Hwang Liou Publications

Sm-Co film is a potential candidate for the future high density recording media of 10 Gb/in2 which requires bit sizes of the order of 300 nm and grain sizes of about 10 nm. This article investigates the microstructure of the Cr underlayer in Sm-Co thin films and its effect on Sm-Co thin films prepared by the dc magnetron sputtering technique. The grain size of the Cr underlayer is found to be about 25 nm. Grains with small angle misorientation usually form local agglomerates. Studies by transmission electron microscopy (TEM) bright field images at different defocus settings and by ...