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Open Access. Powered by Scholars. Published by Universities.®

University of Nebraska - Lincoln

Si-Hwang Liou Publications

2008

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Full-Text Articles in Physics

Dependence Of Noise In Magnetic Tunnel Junction Sensors On Annealing Field And Temperature, Sy-Hwang Liou, Rui Zhang, Stephen Russek, L. Yuan, Sean T. Halloran, David P. Pappas Mar 2008

Dependence Of Noise In Magnetic Tunnel Junction Sensors On Annealing Field And Temperature, Sy-Hwang Liou, Rui Zhang, Stephen Russek, L. Yuan, Sean T. Halloran, David P. Pappas

Si-Hwang Liou Publications

The minimum detectable field of magnetoresistive sensors is limited by their intrinsic noise. Magnetization fluctuations are one of the crucial noise sources and are related to the magnetization alignment at the antiferromagnetic-ferromagnetic interface. In this study, we investigated the low frequency noise of magnetic tunnel junctions (MTJs) annealed in the temperature range from 265 to 305 °C and magnetic fields up to 7 T, either in helium or hydrogen environments. Our results indicate that the magnetic fluctuators in these MTJs changed their frequency based on annealing field and temperature. The noise of the MTJs at low frequency can be reduced ...