Physics Commons^™

Quantitative Assessment Of Sample Stiffness And Sliding Friction From Force Curves In Atomic Force Microscopy, Nancy Burnham, Jon Pratt, Gordon Shaw, Lee Kumanchik

Nancy A. Burnham

It has long been recognized that the angular deflection of an atomic force microscope(AFM) cantilever under “normal” loading conditions can be profoundly influenced by the friction between the tip and the surface. It is shown here that a remarkably quantifiable hysteresis occurs in the slope of loading curves whenever the normal flexural stiffness of the AFM cantilever is greater than that of the sample. This situation arises naturally in cantilever-on-cantilever calibration, but also when trying to measure the stiffness of nanomechanical devices or test structures, or when probing any type of surface or structure that is much more compliant along …